Cuo | CuO | Cu2O | Cu(OH)2 | CuCO3 | Cu2S | CuS | CuSO4 | CuCN | CuNO3 | CuI2 | CuBr2 | CuCl2 | CuF2 |
Basic XPS Information Section
The Basic XPS Information Section provides fundamental XPS spectra, BE values, FWHM values, BE tables, overlays of key spectra, histograms and a table of XPS parameters.
The Advanced XPS Information Section is a collection of additional spectra, overlays of spectra, peak-fit advice, data collection guidance, material info,
common contaminants, degradation during analysis, auto-oxidation, gas capture study, valence band spectra, Auger spectra, and more.
Published literature references, and website links are summarized at the end of the advanced section.
→ Periodic Table – HomePage XPS Database of Polymers → Six (6) BE Tables
Copper (Cu)
Cuprum
Cuprite – Cu2O | Copper – Cuo | Chalcocite – Cu2S |
Page Index | |||
- Expert Knowledge & Explanations
Copper (Cuo) Metal
Peak-fits, BEs, FWHMs, and Peak Labels
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Copper (Cuo) Metal Cu (2p3/2) Spectrum – raw spectrum ion etched clean |
Copper (Cuo) Metal Peak-fit of Cu (2p3/2) Spectrum (w/o asymm) used Voigt peak-shape, with 50% Gauss, no asymmetry |
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Copper (Cuo) Metal Cu (2p) Spectrum – extended range |
Copper (Cuo) Metal Cu (2p) Spectrum – vertically expanded |
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Survey Spectrum of Copper (Cuo) Metal |
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XPS Signals for Copper, (Cuo) Metal Spin-Orbit Term, BE (eV) Value, and Scofield σ for Aluminum Kα X-rays (1486 eV, 8.33 Ang)
σ: abbreviation for the term Scofield Photoionization Cross-Section which is used with IMFP and TF to generate RSFs and atom% quantitation Plasmon and Satellite Peaks Auger Peaks Expected Bandgap for Cu2O: ~2 eV *Scofield Cross-Section (σ) for C (1s) = 1.0
Valence Band Spectrum from Copper (Cuo) Metal
Plasmon Peaks from Cuo Metal Features Observed
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Artefacts Caused by Argon Ion Etching |
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Copper Carbide(s) can form when ion etched Reactive Metal Surfaces capture |
Argon Trapped in Cuo can form when Argon Ions are used |
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Side-by-Side Comparison of |
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Cu Native Oxide | CuO | ||||||||||||||||||||||||||||||
Cu (2p3/2) from Cu Native Oxide Flood Gun OFF As-Measured, C (1s) at 284.9 eV |
Cu (2p3/2) from CuO – pressed powder Flood Gun OFF C (1s) at 285.0 eV |
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Cu Native Oxide | CuO | ||||||||||||||||||||||||||||||
C (1s) from Cu Native Oxide on Copper As-Measured, C (1s) at 284.9 eV (Flood Gun OFF) |
C (1s) from CuO – pressed powder |
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Cu Native Oxide | CuO | ||||||||||||||||||||||||||||||
O (1s) from Cu Native Oxide on Copper As-Measured, C (1s) at 284.9 eV (Flood Gun OFF) |
O (1s) from CuO – pressed powder |
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Cuo | CuO | ||||||||||||||||||||||||||||||
Cu (KLL) Auger Peaks from Cuo ion etched clean |
Cu (KLL) Auger Peaks from CuO – pressed powder |
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Overlay of Auger Peak
Cuo, Cu2O, and CuO
Survey Spectrum of Copper (Cu) Native Oxide
with Peaks Integrated, Assigned and Labelled
Survey Spectrum of Cupric Oxide (CuO)
with Peaks Integrated, Assigned and Labelled
Overlays of Cu (2p3/2) Spectra for:
Cuo metal, Cu Native Oxide, Cu2O, CuO, and CuF2
Overlay of Cu (2p3/2) Cuo metal and Cu Native Oxide (Flood gun OFF) Native Oxide C (1s) = 284.9 |
Overlay of Cu (2p3/2) Cuo metal and CuO Flood Gun OFF C (1s) at 285.0 eV, Chemical Shift 1.0 eV |
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Overlay of Cu (2p3/2) Cuo Metal, Cu Native Oxide, & CuO |
Expanded Overlay of Cu (2p3/2) Cuo Metal, Cu Native Oxide, & CuO Chemical Shift between Cu and CuO = 1.0 eV |
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Overlay of Cu (2p3/2) Cuo metal, Cu2O, and CuO |
Expanded Overlay of Cu (2p3/2) Cuo metal, Cu2O, and CuO C (1s) at 285.0 eV Chemical Shift between Cu and Cu2O = 0.4 eV Chemical Shift between Cu and CuO = 1.0 eV |
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Overlay of Cu (2p3/2) Cuo metal, CuO, and CuF2 |
Expanded Overlay of Cu (2p3/2) Cuo metal, CuO, and CuF2 C (1s) at 285.0 eV Chemical Shift between Cu and CuO = 1.0 eV Chemical Shift between Cu and CuF2 = 0.6 eV |
→ Periodic Table | Copyright ©: The XPS Library |
Features Observed
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- xx
Cuo Ion etched clean |
CuO – pellet or fresh bulk Flood Gun OFF, C (1s) at 285.0 eV |
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Overlay of Valence Band Spectra for Cuo metal and CuO |
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Features Observed
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Copper Minerals, Gemstones, and Chemical Compounds
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Tenorite – CuO | Marshite – CuI | Covellite – CuS | Santarosaite – CuB2O4 |
Six (6) Chemical State Tables of Cu (2p3/2) BEs
- The XPS Library Spectra-Base
- PHI Handbook
- Thermo-Scientific Website
- XPSfitting Website
- Techdb Website
- NIST Website
Notes of Caution when using Published BEs and BE Tables from Insulators and Conductors:
- Accuracy of Published BEs
- The accuracy depends on the calibration BEs used to calibrate the energy scale of the instrument. Cu (2p3) BE can vary from 932.2 to 932.8 eV for old publications
- Different authors use different BEs for the C (1s) BE of the hydrocarbons found in adventitious carbon that appears on all materials and samples. From 284.2 to 285.3 eV
- The accuracy depends on when the authors last checked or adjusted their energy scale to produce the expected calibration BEs
- Worldwide Differences in Energy Scale Calibrations
- For various reasons authors still use older energy scale calibrations
- Some authors still adjust their energy scale so Cu (2p3/2) appears at 932.2 eV or 932.8 eV because this is what the maker taught them
- This range causes BEs in the higher BE end to be larger than expected
- This variation increases significantly above 600 eV BE
- Charge Compensation
- Samples that behave as true insulators normally require the use of a charge neutralizer (electron flood gun with or without Ar+ ions) so that the measured chemical state spectra can be produced without peak-shape distortions or sloping tails on the low BE side of the peak envelop.
- Floating all samples (conductive, semi-conductive, and non-conductive) and always using the electron flood gun is considered to produce more reliable BEs and is recommended.
- Charge Referencing Methods for Insulators
- Charge referencing is a common method, but it can produce results that are less reliable.
- When an electron flood gun is used, the BE scale will usually shift to lower BE values by 0.01 to 5.0 eV depending on your voltage setting. Normally, to correct for this flood gun induced shift, the BE of the hydrocarbon C (1s) peak maximum from adventitious carbon is used to correct for the charge induced shift.
- The hydrocarbon peak is normally the largest peak at the lowest BE.
- Depending on your preference or training, the C (1s) BE assigned to this hydrocarbon peak varies from 284.8 to 285.0 eV. Other BEs can be as low as 284.2 eV or as high as 285.3 eV
- Native oxides that still show the pure metal can suffer differential charging that causes the C (1s) and the O (1s) and the Metal Oxide BE to be larger
- When using the electron flood gun, the instrument operator should adjust the voltage and the XY position of the electron flood gun to produce peaks from a strong XPS signal (eg O (1s) or C (1s) having the most narrow FWHM and the lowest experimentally measured BE.
Table #1
Cu (2p3/2) Chemical State BEs from: “The XPS Library Spectra-Base”
C (1s) BE = 285.0 eV for TXL BEs
and C (1s) BE = 284.8 eV for NIST BEs
Element | Atomic # | Compound | As-Measured by TXL or NIST Average BE | Largest BE | Hydrocarbon C (1s) BE | Source |
Cu | 29 | Cu2Se (N*3) | 931.9 eV | 932.5 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | CuCl | 931.9 eV | 285.0 eV | The XPS Library | |
Cu | 29 | CuI (N*1) | 931.9 eV | 284.8 eV | Avg BE – NIST | |
Cu | 29 | CuS (N*5) | 931.9 eV | 932.5 eV | 285.0 eV | The XPS Library |
Cu | 29 | Cu2Se | 932.0 eV | 932.6 eV | 285.0 eV | The XPS Library |
Cu | 29 | CuCl (N*4) | 932.1 eV | 932.4 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | YBaCuOx | 932.1 eV | 284.8 eV | Avg BE – NIST | |
Cu | 29 | Cu2O (N*14) | 932.2 eV | 932.7 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | Cu2S (N*6) | 932.2 eV | 932.7 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | CuP2 (N*2) | 932.2 eV | 932.4 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | CuNi (N*2) | 932.3 eV | 932.4 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | Cu-S | 932.3 eV | 285.0 eV | The XPS Library | |
Cu | 29 | Cu-2O | 932.5 eV | 285.0 eV | The XPS Library | |
Cu | 29 | Cu – element | 932.67 eV | 285.0 eV | The XPS Library | |
Cu | 29 | CuCN (N*2) | 932.8 eV | 933.1 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | BiSrCaCuOx | 932.9 eV | 285.0 eV | The XPS Library | |
Cu | 29 | BiSrCuOx | 932.9 eV | 285.0 eV | The XPS Library | |
Cu | 29 | Cu-O | 933.0 eV | 285.0 eV | The XPS Library | |
Cu | 29 | CuCN | 933.1 eV | 285.0 eV | The XPS Library | |
Cu | 29 | CuO (N*15) | 933.2 eV | 934.2 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | Cu (OH)2 (N*2) | 934.4 eV | 935.1 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | Cu-(OH)2 | 934.4 eV | 285.0 eV | The XPS Library | |
Cu | 29 | Cu-Cl2 (N*6) | 934.4 eV | 935.6 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | Cu-CO3 | 934.9 eV | 935.2 eV | 285.0 eV | The XPS Library |
Cu | 29 | CuSO4 (N*4) | 934.9 eV | 935.6 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | Cu(NO3)2 (N*1) | 935.5 eV | 284.8 eV | Avg BE – NIST | |
Cu | 29 | Cu-F2 | 936.1 eV | 937.2 eV | 285.0 eV | The XPS Library |
Cu | 29 | CuF2 (N*4) | 936.1 rV | 936.8 eV | 284.8 eV | Avg BE – NIST |
Cu | 29 | Cu-2S | 285.0 eV | The XPS Library | ||
Cu | 29 | Cu-C | 285.0 eV | The XPS Library | ||
Cu | 29 | Cu-N | 285.0 eV | The XPS Library |
Charge Referencing Notes
- (N*number) identifies the number of NIST BEs that were averaged to produce the BE in the middle column.
- The XPS Library uses Binding Energy Scale Calibration with Cu (2p3/2) BE = 932.62 eV and Au (4f7/2) BE = 83.98 eV. BE (eV) Uncertainty Range: +/- 0.2 eV
- Charge Referencing of insulators is defined such that the Adventitious Hydrocarbon C (1s) BE (eV) = 285.0 eV. NIST uses C (1s) BE = 284.8 eV
- Note: Ion etching removes adventitious carbon, implants Ar (+), changes conductivity of surface, and degrades chemistry of various chemical states.
- Note: Ion Etching changes BE of C (1s) hydrocarbon peak.
- TXL – abbreviation for: “The XPS Library” (https://xpslibrary.com). NIST: National Institute for Science and Technology (in USA)
Table #2
Cu (2p3/2) Chemical State BEs from: “PHI Handbook”
C (1s) BE = 284.8 eV
Copyright ©: Ulvac-PHI
Table #3
Cu (2p3/2) Chemical State BEs from: “Thermo-Scientific” Website
C (1s) BE = 284.8 eV
Chemical state | Binding energy (eV), Cu (2p3/2) |
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Cu metal | 933 eV |
Cu (I) oxide | 933 eV |
Cu (II) oxide | ~933.5 eV |
Cu (II) carbonate dihydroxide | 934.7 eV |
Copyright ©: Thermo Scientific
Table #4
Cu (2p3/2) Chemical State BEs from: “XPSfitting” Website
Chemical State BE Table derived by Averaging BEs in the NIST XPS database of BEs
C (1s) BE = 284.8 eV
Copyright ©: Mark Beisinger
Table #5
Cu (2p3/2) Chemical State BEs from: “Techdb.podzone.net” Website
XPS Spectra – Chemical Shift | Binding Energy
C (1s) BE = 284.6 eV
XPS(X線光電子分光法)スペクトル 化学状態 化学シフト ケミカルシフト
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Histograms of NIST BEs for Cu (2p3/2) BEs
Important Note: NIST Database defines Adventitious Hydrocarbon C (1s) BE = 284.8 eV for all insulators.
Histogram indicates: 932.6 eV for Cuo based on 28 literature BEs | Histogram indicates: 932.4 eV for Cu2O based on 18 literature BEs |
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Histogram indicates: 933.6 eV for CuO based on 20 literature BEs | Histogram indicates: 932.5 eV for Cu2S based on 9 literature BEs |
Histogram indicates: 932.5 eV for CuS based on 8 literature BEs |
Histogram indicates: 935.4 eV for CuSO4 based on 5 literature BEs |
Table #6
NIST Database of Cu (2p3/2) Binding Energies
NIST Standard Reference Database 20, Version 4.1
Data compiled and evaluated
by
Alexander V. Naumkin, Anna Kraut-Vass, Stephen W. Gaarenstroom, and Cedric J. Powell
©2012 copyright by the U.S. Secretary of Commerce on behalf of the United States of America. All rights reserved.
Important Note: NIST Database defines Adventitious Hydrocarbon C (1s) BE = 284.8 eV for all insulators.
Element | Spectral Line | Formula | Energy (eV) | Reference |
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Cu | 2p3/2 | [Cu(CN)4(P(C6H5)4)3] | 931.10 | Click |
Cu | 2p3/2 | Cu2Mo3O10 | 931.60 | Click |
Cu | 2p3/2 | CuInSe2 | 931.80 | Click |
Cu | 2p3/2 | Cu(C2H3O2)2 | 931.80 | Click |
Cu | 2p3/2 | CuFe2S3 | 931.80 | Click |
Cu | 2p3/2 | Cu2Se | 931.90 | Click |
Cu | 2p3/2 | Cu2Se | 931.90 | Click |
Cu | 2p3/2 | CuI | 931.90 | Click |
Cu | 2p3/2 | CuInSe2 | 931.90 | Click |
Cu | 2p3/2 | AgCuSe | 931.90 | Click |
Cu | 2p3/2 | CuS | 931.90 | Click |
Cu | 2p3/2 | CuS | 931.90 | Click |
Cu | 2p3/2 | CuSe | 932.00 | Click |
Cu | 2p3/2 | Cu2O | 932.00 | Click |
Cu | 2p3/2 | Cu2O | 932.00 | Click |
Cu | 2p3/2 | CuFeS2 | 932.00 | Click |
Cu | 2p3/2 | [CuI]3[Co(S2(CN(CH2)4)3)] | 932.00 | Click |
Cu | 2p3/2 | CuCl | 932.10 | Click |
Cu | 2p3/2 | CuBr | 932.10 | Click |
Cu | 2p3/2 | CuGaS2 | 932.10 | Click |
Cu | 2p3/2 | CuS | 932.10 | Click |
Cu | 2p3/2 | Cu2S | 932.10 | Click |
Cu | 2p3/2 | Ag71Cu29 | 932.10 | Click |
Cu | 2p3/2 | CuCl | 932.20 | Click |
Cu | 2p3/2 | Cu | 932.20 | Click |
Cu | 2p3/2 | Cu | 932.20 | Click |
Cu | 2p3/2 | Cu | 932.20 | Click |
Cu | 2p3/2 | [Cu(C2H5O)2PS2] | 932.20 | Click |
Cu | 2p3/2 | Cu2O | 932.20 | Click |
Cu | 2p3/2 | Cu2O | 932.20 | Click |
Cu | 2p3/2 | CuP2 | 932.20 | Click |
Cu | 2p3/2 | CuFeS2 | 932.20 | Click |
Cu | 2p3/2 | CuS | 932.20 | Click |
Cu | 2p3/2 | CuS | 932.20 | Click |
Cu | 2p3/2 | Cu2S | 932.20 | Click |
Cu | 2p3/2 | Au3Cu | 932.25 | Click |
Cu | 2p3/2 | Cu | 932.30 | Click |
Cu | 2p3/2 | [CuCl2(P(C6H5)4)] | 932.30 | Click |
Cu | 2p3/2 | [CuCCC6H5] | 932.30 | Click |
Cu | 2p3/2 | CrCuO2 | 932.30 | Click |
Cu | 2p3/2 | Cu2O | 932.30 | Click |
Cu | 2p3/2 | Cu2O | 932.30 | Click |
Cu | 2p3/2 | Cu3AsS4 | 932.30 | Click |
Cu | 2p3/2 | CuS | 932.30 | Click |
Cu | 2p3/2 | CuS | 932.30 | Click |
Cu | 2p3/2 | Cu/Ni | 932.30 | Click |
Cu | 2p3/2 | CuInS2 | 932.30 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 932.32 | Click |
Cu | 2p3/2 | [CuC6H5CCP(C6H5)3]4 | 932.40 | Click |
Cu | 2p3/2 | CuCl | 932.40 | Click |
Cu | 2p3/2 | CuCl | 932.40 | Click |
Cu | 2p3/2 | CuBr | 932.40 | Click |
Cu | 2p3/2 | Cu2O | 932.40 | Click |
Cu | 2p3/2 | Cu2O | 932.40 | Click |
Cu | 2p3/2 | Cu2O | 932.40 | Click |
Cu | 2p3/2 | Cu2O | 932.40 | Click |
Cu | 2p3/2 | CuP2 | 932.40 | Click |
Cu | 2p3/2 | CuInS2 | 932.40 | Click |
Cu | 2p3/2 | CuCo2S4 | 932.40 | Click |
Cu | 2p3/2 | Cu2S | 932.40 | Click |
Cu | 2p3/2 | Cu2S | 932.40 | Click |
Cu | 2p3/2 | Cu/Ni | 932.40 | Click |
Cu | 2p3/2 | CuFeS2 | 932.40 | Click |
Cu | 2p3/2 | Pd/Cu | 932.40 | Click |
Cu | 2p3/2 | CuInS2 | 932.40 | Click |
Cu | 2p3/2 | AuCu | 932.40 | Click |
Cu | 2p3/2 | Ag28.6Au17.1Cu54.3 | 932.40 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 932.41 | Click |
Cu | 2p3/2 | Au3Cu | 932.41 | Click |
Cu | 2p3/2 | AuCu3 | 932.45 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 932.45 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 932.45 | Click |
Cu | 2p3/2 | AuCu3 | 932.47 | Click |
Cu | 2p3/2 | CuInSe2 | 932.49 | Click |
Cu | 2p3/2 | CuInSe2 | 932.49 | Click |
Cu | 2p3/2 | CuCl | 932.50 | Click |
Cu | 2p3/2 | Cu | 932.50 | Click |
Cu | 2p3/2 | Cu | 932.50 | Click |
Cu | 2p3/2 | Cu2Se | 932.50 | Click |
Cu | 2p3/2 | [N(C2H5)4]2[CuCl4] | 932.50 | Click |
Cu | 2p3/2 | Cu2O | 932.50 | Click |
Cu | 2p3/2 | Cu2O | 932.50 | Click |
Cu | 2p3/2 | CuS | 932.50 | Click |
Cu | 2p3/2 | Cu2S | 932.50 | Click |
Cu | 2p3/2 | Cu2S | 932.50 | Click |
Cu | 2p3/2 | (GeO2)0.5(Na2O)0.3(CuO)0.2 | 932.50 | Click |
Cu | 2p3/2 | O2/Cu/Ni | 932.50 | Click |
Cu | 2p3/2 | O2/Cu/Ni | 932.50 | Click |
Cu | 2p3/2 | O2/Cu/Ni | 932.50 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 932.50 | Click |
Cu | 2p3/2 | Pd/Cu | 932.50 | Click |
Cu | 2p3/2 | Cu1.87S | 932.50 | Click |
Cu | 2p3/2 | Zn/Cu | 932.50 | Click |
Cu | 2p3/2 | Zn/Cu | 932.50 | Click |
Cu | 2p3/2 | CuGa5Se8 | 932.50 | Click |
Cu | 2p3/2 | AuCu7 | 932.51 | Click |
Cu | 2p3/2 | CuI | 932.52 | Click |
Cu | 2p3/2 | AuCu | 932.52 | Click |
Cu | 2p3/2 | Cu | 932.53 | Click |
Cu | 2p3/2 | Cu | 932.55 | Click |
Cu | 2p3/2 | Cu | 932.57 | Click |
Cu | 2p3/2 | AuCu19 | 932.58 | Click |
Cu | 2p3/2 | CuCl | 932.60 | Click |
Cu | 2p3/2 | Cu | 932.60 | Click |
Cu | 2p3/2 | Cu | 932.60 | Click |
Cu | 2p3/2 | Cu | 932.60 | Click |
Cu | 2p3/2 | Cu | 932.60 | Click |
Cu | 2p3/2 | Cu | 932.60 | Click |
Cu | 2p3/2 | Cu64Zn36 | 932.60 | Click |
Cu | 2p3/2 | CuFeO2 | 932.60 | Click |
Cu | 2p3/2 | Cu2O | 932.60 | Click |
Cu | 2p3/2 | Cu2O | 932.60 | Click |
Cu | 2p3/2 | Cu2O | 932.60 | Click |
Cu | 2p3/2 | Cu2O | 932.60 | Click |
Cu | 2p3/2 | Cu2S | 932.60 | Click |
Cu | 2p3/2 | O2/Cu/Ni | 932.60 | Click |
Cu | 2p3/2 | La/Cu | 932.60 | Click |
Cu | 2p3/2 | Pd/Cu | 932.60 | Click |
Cu | 2p3/2 | Cu/Ni | 932.60 | Click |
Cu | 2p3/2 | Cu/Ni | 932.60 | Click |
Cu | 2p3/2 | Cu/Ni | 932.60 | Click |
Cu | 2p3/2 | Cu | 932.61 | Click |
Cu | 2p3/2 | Cu | 932.62 | Click |
Cu | 2p3/2 | Cu | 932.63 | Click |
Cu | 2p3/2 | Cu | 932.66 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 932.66 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 932.66 | Click |
Cu | 2p3/2 | Cu | 932.67 | Click |
Cu | 2p3/2 | Cu | 932.67 | Click |
Cu | 2p3/2 | Cu | 932.67 | Click |
Cu | 2p3/2 | Ti(OCH(CH3)2)4 | 932.67 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 932.69 | Click |
Cu | 2p3/2 | [Cu(-C-6H5N3)] | 932.70 | Click |
Cu | 2p3/2 | Cu | 932.70 | Click |
Cu | 2p3/2 | Cu | 932.70 | Click |
Cu | 2p3/2 | Cu | 932.70 | Click |
Cu | 2p3/2 | CuO | 932.70 | Click |
Cu | 2p3/2 | Cu2O | 932.70 | Click |
Cu | 2p3/2 | Cu2O | 932.70 | Click |
Cu | 2p3/2 | Cu2O | 932.70 | Click |
Cu | 2p3/2 | Cu2S | 932.70 | Click |
Cu | 2p3/2 | (GeO2)0.65(Na2O)0.3(CuO)0.05 | 932.70 | Click |
Cu | 2p3/2 | Cu/Si | 932.70 | Click |
Cu | 2p3/2 | Cu(OH)2 | 932.70 | Click |
Cu | 2p3/2 | Cu/O2 | 932.70 | Click |
Cu | 2p3/2 | Cu/O2 | 932.70 | Click |
Cu | 2p3/2 | Cu/O2 | 932.70 | Click |
Cu | 2p3/2 | CuIn3Se5 | 932.70 | Click |
Cu | 2p3/2 | [CuClP(C6H5)3]4 | 932.80 | Click |
Cu | 2p3/2 | CuCN | 932.80 | Click |
Cu | 2p3/2 | Cu | 932.80 | Click |
Cu | 2p3/2 | Cu | 932.80 | Click |
Cu | 2p3/2 | Cu | 932.80 | Click |
Cu | 2p3/2 | [CuBr2(P(C6H5)4)] | 932.80 | Click |
Cu | 2p3/2 | [CuCl((C6H5)3P)3] | 932.80 | Click |
Cu | 2p3/2 | Cu2O | 932.80 | Click |
Cu | 2p3/2 | (GeO2)0.6(Na2O)0.3(CuO)0.1 | 932.80 | Click |
Cu | 2p3/2 | Cu/NiO/Ni | 932.80 | Click |
Cu | 2p3/2 | Cu/S | 932.80 | Click |
Cu | 2p3/2 | (C112H166N2O4)n/Cu | 932.80 | Click |
Cu | 2p3/2 | Al5Cu95 | 932.80 | Click |
Cu | 2p3/2 | (C100H158N2O4)n/Cu | 932.80 | Click |
Cu | 2p3/2 | C82H114Br2N2O4/Cu | 932.80 | Click |
Cu | 2p3/2 | Y/Cu | 932.82 | Click |
Cu | 2p3/2 | [Cu(C5H10N)2(CS2)2] | 932.90 | Click |
Cu | 2p3/2 | CuO | 932.90 | Click |
Cu | 2p3/2 | Cu2S | 932.90 | Click |
Cu | 2p3/2 | Cu2S | 932.90 | Click |
Cu | 2p3/2 | La/Cu | 932.90 | Click |
Cu | 2p3/2 | [CuCl(C7H6N2S)] | 933.00 | Click |
Cu | 2p3/2 | Cu | 933.00 | Click |
Cu | 2p3/2 | Cu/NiO/Ni | 933.00 | Click |
Cu | 2p3/2 | Cu/NiO/Ni | 933.00 | Click |
Cu | 2p3/2 | O2/Cu/NiO/Ni | 933.00 | Click |
Cu | 2p3/2 | Al12Cu88 | 933.00 | Click |
Cu | 2p3/2 | CuInS2 | 933.00 | Click |
Cu | 2p3/2 | [(Pt2(P(C6H5)3)4S2Cu)2(mu-dppf)][PF6]2 | 933.00 | Click |
Cu | 2p3/2 | CuCN | 933.10 | Click |
Cu | 2p3/2 | Cu | 933.10 | Click |
Cu | 2p3/2 | [CuBr4(P(C6H5)4)3] | 933.10 | Click |
Cu | 2p3/2 | O2/Cu3Sn | 933.10 | Click |
Cu | 2p3/2 | Y/Cu | 933.17 | Click |
Cu | 2p3/2 | [CuC(CN)3] | 933.20 | Click |
Cu | 2p3/2 | [CuBr3(P(C6H5)4)] | 933.20 | Click |
Cu | 2p3/2 | CuO | 933.20 | Click |
Cu | 2p3/2 | CuO | 933.20 | Click |
Cu | 2p3/2 | Al17Cu83 | 933.20 | Click |
Cu | 2p3/2 | Cu3Sn | 933.20 | Click |
Cu | 2p3/2 | O2/Cu3Sn | 933.20 | Click |
Cu | 2p3/2 | O2/Cu3Sn | 933.20 | Click |
Cu | 2p3/2 | Cu/ZnO | 933.22 | Click |
Cu | 2p3/2 | [CuS(C6H4NCS)] | 933.30 | Click |
Cu | 2p3/2 | CuBr2 | 933.30 | Click |
Cu | 2p3/2 | CuBr2 | 933.30 | Click |
Cu | 2p3/2 | CuO | 933.30 | Click |
Cu | 2p3/2 | CuO | 933.40 | Click |
Cu | 2p3/2 | CuO | 933.40 | Click |
Cu | 2p3/2 | YBa2Cu3O7 | 933.40 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 933.43 | Click |
Cu | 2p3/2 | Bi2Sr2CaCu2O8 | 933.47 | Click |
Cu | 2p3/2 | [CuCl3(P(C6H5)4)] | 933.50 | Click |
Cu | 2p3/2 | CuO | 933.50 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 933.51 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 933.51 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 933.54 | Click |
Cu | 2p3/2 | CuO | 933.60 | Click |
Cu | 2p3/2 | CuO | 933.60 | Click |
Cu | 2p3/2 | CuO | 933.60 | Click |
Cu | 2p3/2 | CuO | 933.60 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 933.60 | Click |
Cu | 2p3/2 | [Cu(HSCH2CHNH2COO)] | 933.70 | Click |
Cu | 2p3/2 | CuFe2O4 | 933.70 | Click |
Cu | 2p3/2 | YBa2Cu3O7 | 933.70 | Click |
Cu | 2p3/2 | [Cu((C6H5)2PS(C2H5))2]ClO4 | 933.80 | Click |
Cu | 2p3/2 | [Cu((C6H5)PS(C6H5)2)2]ClO4 | 933.80 | Click |
Cu | 2p3/2 | CuFe2O4 | 933.80 | Click |
Cu | 2p3/2 | CuO | 933.80 | Click |
Cu | 2p3/2 | CuO | 933.80 | Click |
Cu | 2p3/2 | CuO | 933.80 | Click |
Cu | 2p3/2 | CuO | 933.80 | Click |
Cu | 2p3/2 | CuO | 933.80 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 933.81 | Click |
Cu | 2p3/2 | [Cu(SC(SCH3)CHC(C6H5)O)2] | 933.90 | Click |
Cu | 2p3/2 | CuO | 933.90 | Click |
Cu | 2p3/2 | CuO | 933.90 | Click |
Cu | 2p3/2 | CuO | 933.90 | Click |
Cu | 2p3/2 | CuO | 933.90 | Click |
Cu | 2p3/2 | [Cu(HONCHC6H4O)2] | 933.95 | Click |
Cu | 2p3/2 | CuCl2 | 934.00 | Click |
Cu | 2p3/2 | CuCl2 | 934.00 | Click |
Cu | 2p3/2 | CuO | 934.00 | Click |
Cu | 2p3/2 | CuO | 934.00 | Click |
Cu | 2p3/2 | CuMoO4 | 934.10 | Click |
Cu | 2p3/2 | Cu3Mo2O9 | 934.10 | Click |
Cu | 2p3/2 | CuO | 934.10 | Click |
Cu | 2p3/2 | [(CH3)2NC6H3NSC6H3N(CH3)2]2[Cu(NCC(S)C(S)CN)2] | 934.10 | Click |
Cu | 2p3/2 | [N(C4H9)4]2[Cu((-CC(O)C(S)C(S)C(O)-)C(CN)2)2] | 934.10 | Click |
Cu | 2p3/2 | O2/Cu/NiO/Ni | 934.10 | Click |
Cu | 2p3/2 | CuBr2 | 934.20 | Click |
Cu | 2p3/2 | CuBr2 | 934.20 | Click |
Cu | 2p3/2 | CuO | 934.20 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 934.20 | Click |
Cu | 2p3/2 | Cu/HS(CH2)11CN/Au | 934.23 | Click |
Cu | 2p3/2 | CuCl2 | 934.40 | Click |
Cu | 2p3/2 | Cu(OH)2 | 934.40 | Click |
Cu | 2p3/2 | CuRh2O4 | 934.40 | Click |
Cu | 2p3/2 | CuO | 934.40 | Click |
Cu | 2p3/2 | K2[Cu(HNC(O)NHC(O)NH)2] | 934.50 | Click |
Cu | 2p3/2 | K2[Cu(HNC(O)NHC(O)NH)2].2H20 | 934.50 | Click |
Cu | 2p3/2 | [Cu(CH3C(O)CHC(O)CH3)2] | 934.50 | Click |
Cu | 2p3/2 | CuCr2O4 | 934.60 | Click |
Cu | 2p3/2 | CuO | 934.60 | Click |
Cu | 2p3/2 | [N(C4H9)4]2[Cu(-CC(O)CC(S)C(S)-)2] | 934.60 | Click |
Cu | 2p3/2 | YBa2Cu3O7 | 934.60 | Click |
Cu | 2p3/2 | Cu2CO3(OH)2 | 934.60 | Click |
Cu | 2p3/2 | Al2CuO4 | 934.70 | Click |
Cu | 2p3/2 | Cu(OH)2 | 934.70 | Click |
Cu | 2p3/2 | [Cu(C2O4)2(P(C6H5)4)2] | 934.80 | Click |
Cu | 2p3/2 | CuCl2 | 934.80 | Click |
Cu | 2p3/2 | CuBr2 | 934.80 | Click |
Cu | 2p3/2 | CuBr2 | 934.80 | Click |
Cu | 2p3/2 | CuBr2 | 934.80 | Click |
Cu | 2p3/2 | CuBr2 | 934.80 | Click |
Cu | 2p3/2 | [N(C4H9)4]2[Cu(NCC(S)C(S)CN)2] | 934.80 | Click |
Cu | 2p3/2 | CuMn2O4 | 934.80 | Click |
Cu | 2p3/2 | [Cu(-C-6H5N3)] | 934.90 | Click |
Cu | 2p3/2 | CuSiO3 | 934.90 | Click |
Cu | 2p3/2 | CuSO4 | 934.90 | Click |
Cu | 2p3/2 | CuSO4 | 934.90 | Click |
Cu | 2p3/2 | [N(C4H9)4]2[Cu(-C(S)C(S)C(O)C(O)-)2] | 934.90 | Click |
Cu | 2p3/2 | CuCO3 | 935.00 | Click |
Cu | 2p3/2 | [Cu(C9H6NO)2] | 935.00 | Click |
Cu | 2p3/2 | Cu3(SO4)(OH)4 | 935.00 | Click |
Cu | 2p3/2 | Cu(C2H3O2)2 | 935.00 | Click |
Cu | 2p3/2 | Al2CuO4 | 935.00 | Click |
Cu | 2p3/2 | CuCr2O4 | 935.00 | Click |
Cu | 2p3/2 | CuS | 935.00 | Click |
Cu | 2p3/2 | Cu(OH)2 | 935.10 | Click |
Cu | 2p3/2 | CuCl2 | 935.10 | Click |
Cu | 2p3/2 | [Cu((C6H5)2P(O)SC6H5)2](ClO4)2 | 935.20 | Click |
Cu | 2p3/2 | CuCl2 | 935.20 | Click |
Cu | 2p3/2 | Cu(UO2)2(PO4)2.8H2O | 935.20 | Click |
Cu | 2p3/2 | CuSiO2(OH)2 | 935.20 | Click |
Cu | 2p3/2 | [N(CH3)4]2[Cu(NCC(S)C(S)CN)2] | 935.20 | Click |
Cu | 2p3/2 | [Cu((C6H5)2P(O)SC2H5)2](ClO4)2 | 935.40 | Click |
Cu | 2p3/2 | CuSiO3.2H2O | 935.40 | Click |
Cu | 2p3/2 | C32H16CuN8 | 935.40 | Click |
Cu | 2p3/2 | K[Cu(HNC(O)NHC(O)NH)2] | 935.50 | Click |
Cu | 2p3/2 | [Cu(C6H5O)2(C(CN)H2C(CN)H2)] | 935.50 | Click |
Cu | 2p3/2 | Cu(NO3)2 | 935.50 | Click |
Cu | 2p3/2 | CuSO4 | 935.50 | Click |
Cu | 2p3/2 | CuCl2 | 935.60 | Click |
Cu | 2p3/2 | CuCl2 | 935.60 | Click |
Cu | 2p3/2 | CuSO4.nH2O | 935.60 | Click |
Cu | 2p3/2 | YBa2Cu3O7 | 935.70 | Click |
Cu | 2p3/2 | [Cu(H2NC(O)NHC(O)NH2)2]Cl2 | 935.80 | Click |
Cu | 2p3/2 | CuF2 | 936.00 | Click |
Cu | 2p3/2 | CuF2 | 936.00 | Click |
Cu | 2p3/2 | CuF2 | 936.00 | Click |
Cu | 2p3/2 | CuF2 | 936.00 | Click |
Cu | 2p3/2 | CuSO4 | 936.00 | Click |
Cu | 2p3/2 | CuF2 | 936.10 | Click |
Cu | 2p3/2 | CuF2 | 936.10 | Click |
Cu | 2p3/2 | CuF2 | 936.50 | Click |
Cu | 2p3/2 | CuF2 | 936.50 | Click |
Cu | 2p3/2 | CuF2 | 936.80 | Click |
Cu | 2p3/2 | CuF2 | 936.80 | Click |
Cu | 2p3/2 | CuF2 | 937.00 | Click |
Cu | 2p3/2 | CuF2 | 937.00 | Click |
Statistical Analysis of Binding Energies in NIST XPS Database of BEs
Advanced XPS Information Section
Expert Knowledge, Spectra, Features, Guidance and Cautions
for XPS Research Studies on Copper Materials
Expert Knowledge Explanations
Copper Chemical Compounds
Peak-fits and Overlays of Chemical State Spectra
Pure Copper (Cuo): Cu (2p) Cu (2p3/2) BE = 932.6 eV |
CuO: Cu (2p) C (1s) BE = 285.0 eV |
CuF2: Cu (2p) C (1s) BE = 285.0 eV |
Features Observed
- xx
- xx
- xx
Overlay of Cu (2p) Spectra shown Above
C (1s) BE = 285.0 eV
Chemical Shift between Cu and CuO: xx eV
Chemical Shift between Cu and Cu2O3: xx eV
Copper Oxide (CuO)
pressed powder
Survey Spectrum from CuO Flood gun is ON, C (1s) BE = 285.0 eV |
Cu (2p3/2) Chemical State Spectrum from CuO Flood gun is ON, C (1s) BE = 285.0 eV |
|
|
. | |
O (1s) Chemical State Spectrum from CuO Flood gun is ON, C (1s) BE = 285.0 eV |
C (1s) Chemical State Spectrum from CuO Flood gun is ON, C (1s) BE = 285.0 eV |
|
|
. | |
Cu (3s) Chemical State Spectrum from CuO Flood gun is ON, C (1s) BE = 285.0 eV |
Cu (3p) Chemical State Spectrum from CuO Flood gun is ON, C (1s) BE = 285.0 eV |
|
|
. | |
Valence Band Spectrum from CuO Flood gun is ON, C (1s) BE = 285.0 eV |
Auger Signals from CuO Flood gun is ON, C (1s) BE = 285.0 eV |
Shake-up Features
in CuO
Cu (2p3/2) in Cuo | Cu (2p3/2) in CuO |
Multiplet Splitting Features for
Copper Compounds
Cu metal – NO Splitting for Cu (3s) | CuO Compound – Multiplet Splitting Peaks for Cu (3s) |
. |
|
Cu2O – Multiplet Splitting for Cu (3s) | CuF2 Compound – Multiplet Splitting Peaks for Cu (3s) |
Overlay of
“3s” Spectra for Cu, Cu2O, CuO, and CuF2
Multiplet Splitting Comparison
Features Observed
- xx
- xx
- xx
Copper Chemical Compounds
Cupric Fluoride, CuF2
Survey Spectrum from CuF2 (pressed powder) This survey was run at Start, so this survey has least degradation, but still the F atom% is low. Cu (2p) signals were peak-fit – shown below |
|
|
|
Survey Spectrum from CuF2 Flood gun is ON, C (1s) BE = 285.0 eV This survey was run at the start, so degradation is minimum |
Cu (2p3/2) Chemical State Spectrum from CuF2 The large FWHM is due to the use of a large pass energy used in survey This peak-fit represents the true peaks in CuF2 as much as possible This survey data was run at the start, so degradation is minimum |
|
|
. | |
Cu (2p) Chemical State Spectrum from CuF2 Significant degradation is present – loss of Fluorine. Compare to the above spectrum. This data was collected ~30 minutes later after significant degradation had occurred |
C (1s) Chemical State Spectrum from CuF2 Spectrum suffers from significant degradation – loss of Fluorine |
|
|
Multiplet Splitting of Cu (3s) Cu (3s) Chemical State Spectrum from CuF2 Spectrum suffers from significant degradation – loss of Fluorine |
Cu (3p) Chemical State Spectrum from CuF2 Spectrum suffers from significant degradation – loss of Fluorine |
|
|
. | |
Valence Band Spectrum from CuF2 Spectrum suffers from significant degradation – loss of Fluorine |
Auger Signals from CuF2 Spectrum suffers from significant degradation – loss of Fluorine |
Quantitation Details and Information
Quantitation by XPS is often incorrectly done, in many laboratories, by integrating only the main peak, ignoring the Electron Loss peak, and the satellites that appear as much as 30 eV above the main peak. By ignoring the electron loss peak and the satellites, the accuracy of the atom% quantitation is in error.
When using theoretically calculated Scofield cross-section values, the data must be corrected for the transmission function effect, use the calculated TPP-2M IMFP values, the pass energy effect on the transmission function, and the peak area used for calculation must include the electron loss peak area, shake-up peak area, multiplet-splitting peak area, and satellites that occur within 30 eV of the main peak.
Quantitation from Pure, Homogeneous Binary Compound
composed of Copper – CuO
This section is focused on measuring and reporting the atom % quantitation that results by using:
- Scofield cross-sections,
- Spectra corrected to be free from Transmission Function effects
- A Pass Energy that does not saturate the detector system in the low KE range (BE = 1000-1400 eV)
- A focused beam of X-ray smaller than the field of view of the lens
- An angle between the lens and the source that is ~55 deg that negates the effects of beta-asymmetry
- TPP-2M inelastic mean free path values, and
- Either a linear background or an iterated Shirley (Sherwood-Proctor) background to define peak areas
The results show here are examples of a method being developed that is expected to improve the “accuracy” or “reliability” of the atom % values produced by XPS.
Flood Gun Effect on Native Oxide of Copper
Native Oxide of Copper Sheet – Sample GROUNDED
versus
Native Oxide of Copper Sheet – Sample FLOATING
Native Oxide of Copper Sheet – Sample Grounded
Electron Flood Gun: 0 Voltage (FG OFF), Min Voltage versus Max Voltage
Cu (2p3/2) | O (1s) | C (1s) |
→ Periodic Table |
Native Oxide of Copper Sheet – Sample Floating
Electron Flood Gun: 0 Voltage (FG OFF), Min Voltage versus Max Voltage
Cu (2p3/2) | O (1s) | C (1s) |
→ Periodic Table |
Cu (2p) Signal
|
O (1s) Signal | C (1s) Signal |
AES Study of UHV Gas Captured by Freshly Ion Etched Copper
Copper sheet was ion etched and allowed to react with residual UHV gases overnight – ~14 hr run.
Cu (LMM) Signal: Cu at front -> CuOx X at rear Cu KE = 913.6 eV |
O (KLL) Signal: Cu at front -> CuOx X at rear O KE = 508 eV |
C (KLL) Signal: Cu at front -> CuOx at rear C KE = 265.3 eV |
|
||
Chemical State Spectra from CuO using Charge Control by AES |
||
Cu (KLL) Signal: CuO w charge control – JEOL Hemi-sphere (HSA) – 25 kV High Energy Resolution Mode for Chemical States |
O (KLL) Signal: CuO w charge control – JEOL Hemi-sphere (HSA) – 25 kV High Energy Resolution Mode for Chemical States |
C (KLL) Signal: CuO w charge control – JEOL Hemi-sphere (HSA) – 25 kV High Energy Resolution Mode for Chemical State |
Features Observed
- xx
- xx
- xx
Chemical State Spectra from:
Slow Depth Profile of Cu Native Oxide by AES
Native Cu Oxide on Cu ribbon was slowly ion etched using High Energy Resolution conditions to measure Chemical States by Auger
Cu (LMM) Cu KE = 918.2 eV CuOx KE = 916.4 eV |
C (KLL) C KE = 264 eV |
Copper Alloys
XxCu | XxCu |
→ Periodic Table | |
XxCu | XxCu |
Copyright ©: The XPS Library
XPS Facts, Guidance & Information
Element | Copper (Cu) |
||||
Primary XPS peak used for Peak-fitting: | Cu (2p3/2) | ||||
Spin-Orbit (S-O) splitting for Primary Peak: | Spin-Orbit splitting for “p” orbital, ΔBE = 20.0eV |
||||
Binding Energy (BE) of Primary XPS Signal: | 932.6 eV |
||||
Scofield Cross-Section (σ) Value: | Cu (2p3/2) =16.73 Cu (2p1/2) = 8.66 |
||||
Conductivity: | Cu resistivity = Native Oxide suffers Differential Charing |
||||
Range of Cu (2p) Chemical State BEs: | 931 – 936 eV range (Cuo to CuF2) | ||||
Signals from other elements that overlap Cu (2p) Primary Peak: |
xx (xx) | ||||
Bulk Plasmons: | ~xx eV above peak max for pure | ||||
Shake-up Peaks: | xx | ||||
Multiplet Splitting Peaks: | xx | ||||
|
|
General Information about XXX Compounds: |
xx | ||
Cautions – Chemical Poison Warning |
xx |
Copyright ©: The XPS Library
Information Useful for Peak-fitting Cu (2p)
- FWHM (eV) of Cu (2p3/2) from Pure Cuo : ~0.92 eV using 50 eV Pass Energy after ion etching:
- FWHM (eV) of Cu (2p3/2) from Cu2O xtal: ~1.2 eV using 50 eV Pass Energy (before ion etching)
- Binding Energy (BE) of Primary Signal used for Measuring Chemical State Spectra: 932.6 eV for Cu (2p3/2) with +/- 0.2 uncertainty
- List of XPS Peaks that can Overlap Peak-fit results for Cu (2p): xxxx
General Guidelines for Peak-fitting XPS Signals
- Typical Energy Resolution for Pass Energy (PE) setting used to measure Chemical State Spectra on Various XPS Instruments
- Ag (3d5/2) FWHM (eV) = ~0.95 eV for PE 50 on Thermo K-Alpha
- Ag (3d5/2) FWHM (eV) = ~1.00 eV for PE 80 on Kratos Nova
- Ag (3d5/2) FWHM (eV) = ~0.95 eV for PE 45 on PHI VersaProbe
- FWHM (eV) of Pure Elements: Ranges from 0.4 to 1.0 eV across the periodic table
- FWHM of Chemical State Peaks in any Chemical Compound: Ranges from 1.1 to 1.6 eV (in rare cases FWHM can be 1.8 to 2.0 eV)
- FWHM of Pure Element versus FWHM of Oxide: Pure element FWHM << Oxide FWHM (e.g. 0.8 vs 1.5 eV, roughly 2x)
- If FWHM Greater than 1.6 eV: When a peak FWHM is larger than 1.6 eV, it is best to add another peak to the peak-fit envelop.
- BE (eV) Difference in Chemical States: The difference in chemical state BEs is typically 1.0-1.3 eV apart. In rare cases, <0.8 eV.
- Number of Peaks to Use: Use minimum. Do not use peaks with FWHM < 1.0 eV unless it is a or a conductive compound.
- Typical Peak-Shape: 80% G: 20% L, or Voigt : 1.4 eV Gaussian and 0.5 eV Lorentzian
- Spin-Orbit Splitting of Two Peaks (due to Coupling): The ratio of the two (2) peak areas must be constrained.
Notes:
- Other Oxidation States can appear as small peaks when peak-fitting
- Pure element signals normally have asymmetric tails that should be included in the peak-fit.
- Gaseous state materials often display asymmetric tails due to vibrational broadening.
- Peak-fits of C (1s) in polymers include an asymmetric tail when the energy resolution is very high.
- Binding energy shifts of some compounds are negative due to unusual electron polarization.
Contaminants Specific to Copper
- Copper develops a thick native oxide due to the reactive nature of clean Copper .
- The native oxide of CuOx is 1-2 nm thick.
- Copper thin films often have a low level of iron (Fe) in the bulk as a contaminant or to strengthen the thin film
- Copper forms a low level of carbide when the surface is ion etched inside the analysis chamber
Commonplace Contaminants
- Carbon and Oxygen are common contaminants that appear on nearly all surfaces. The amount of Carbon usually depends on handling.
- Carbon is usually the major contaminant. The amount of carbon ranges from 5-50 atom%.
- Carbon contamination is attributed to air-borne organic gases that become trapped by the surface, oils transferred to the surface from packaging containers, static electricity, or handling of the product in the production environment.
- Carbon contamination is normally a mixture of different chemical states of carbon (hydrocarbon, alcohol or ether, and ester or acid).
- Hydrocarbon is the dominant form of carbon contamination. It is normally 2-4x larger than the other chemical states of carbon.
- Carbonate peaks, if they appear, normally appear ~4.5 eV above the hydrocarbon C (1s) peak max BE.
- Low levels of carbonate is common on many s that readily oxidize in the air.
- High levels of carbonate appear on reactive oxides and various hydroxides. This is due to reaction between the oxide and CO2 in the air.
- Hydroxide contamination peak is due to the reaction with residual water in the lab air or the vacuum.
- The O (1s) BE of the hydroxide (water) contamination normally appears 0.5 to 1.0 eV above the oxide peak
- Sodium (Na), Potassium (K), Sulfur (S) and Chlorine (Cl) are common trace to low level contaminants
- To find low level contaminants it is very useful to vertically expand the 0-600 eV region of the survey spectrum by 5-10X
- A tiny peak that has 3 or more adjacent data-points above the average noise of the background is considerate to be a real peak
- Carbides can appear after ion etching various reactive s. Carbides form due to the residual CO and CH4 in the vacuum.
- Ion etching can produce low oxidation states of the material being analyzed. These are newly formed contaminants.
- Ion etching polymers by using standard Ar+ ion guns will destroy the polymer, converting it into a graphitic type of carbon
Data Collection Guidance
- Chemical state differentiation can be difficult
- Collect principal Cu (2p) peak as well as Cu (3p) and Cu (Auger).
- Long time exposures (high dose) to X-rays can degrade various polymers, catalysts, high oxidation state compounds
- During XPS analysis, water or solvents can be lost due to high vacuum or irradiation with X-rays or Electron flood gun
- Auger signals can sometimes be used to discern chemical state shifts when XPS shifts are very small
Data Collection Settings for Copper (Cu)
- Conductivity: Copper readily develops a native oxide that is sensitive to Flood Gun – Differential Charging Possible – float sample recommended
- Primary Peak (XPS Signal) used to measure Chemical State Spectra: Cu (2p3) at 932.6 eV
- Recommended Pass Energy for Measuring Chemical State Spectrum: 40-50 eV (Produces Ag (3d5/2) FWHM ~0.7 eV)
- Recommended # of Scans for Measuring Chemical State Spectrum: 4-5 scans normally (Use 10-25 scans to improve S/N)
- Dwell Time: 50 msec/point
- Step Size: 0.1 eV/point (0.1 eV/step or 0.1 eV/channel)
- Standard BE Range for Measuring Chemical State Spectrum: 920 – 950 eV
- Recommended Extended BE Range for Measuring Chemical State Spectrum: 920 – 1020 eV
- Recommended BE Range for Survey Spectrum: -10 to 1,100 eV (above 1,100 eV there are no useful XPS signals, except for Ge and Ga)
- Typical Time for Survey Spectrum: 3-5 minutes for newer instruments, 5-10 minutes for older instruments
- Typical Time for a single Chemical State Spectrum with high S/N: 5-10 minutes for newer instruments, 10-15 minutes for older instruments
Effects of Argon Ion Etching
- Ion etching can produce low oxidation states of the material being analyzed. These are newly formed contaminants.
- Ion etching polymers by using standard Ar+ ion guns will destroy the polymer, converting it into a graphitic type of carbon
Interpretation of XPS spectra
- Cu2p peak has significantly split spin-orbit components (Δ=19.75eV, intensity ratio=0.508)
- Possible to distinguish Cu oxidation states using satellite features of Cu2p.
- Cu (II) has observable collection of satellite features 943eV.
- Cu2p3/2 peak in Cu (II) oxide is shifted and is much broader compared to Cu (I) oxide.
In Cu (I) oxide, there is only a very weak satellite at 945eV.
Cu2p3/2 peak in Cu (I) oxide is NOT shifted but is broader compared to Cu metal.
- Several Copper BEs from compounds have small binding energy shifts compared to copper metal, so we often analyze the Cu Auger peak BEs
- Collect principal Cu LMM peak as well as Cu2p. Bigger chemical shifts observed for Cu LMM compared to Cu2p.
- Use Wagner plot to help assign chemistry.
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