Basic XPS Information Section

The Basic XPS Information Section provides fundamental XPS spectra, BE values, FWHM values, BE tables, overlays of key spectra, histograms and a table of XPS parameters.
The Advanced XPS Information Section is a collection of additional spectra, overlays of spectra, peak-fit advice, data collection guidance, material info,
common contaminants, degradation during analysis, auto-oxidation, gas capture study, valence band spectra, Auger spectra, and more.
Published literature references, and website links are summarized at the end of the advanced section.
→  Periodic Table – HomePage                   XPS Database of Polymers                     → Six (6) BE Tables 

 

Samarium (Sm)

 

Samarium-Cobalt Alloy – Sm2Co7  (magnet) Samarium Metal – Smo Samarium Oxide – Sm2O3

 

  Page Index
  • Expert Knowledge & Explanations


Samarium (Smo) Metal

Peak-fits, BEs, FWHMs, and Peak Labels

.

Samarium (Smo) Metal
Sm (3d) Spectrum – raw spectrum		 Samarium (Smo) Metal
Peak-fit of Sm (3d) Spectrum (w/o asymm)
→  Periodic Table – HomePage  
Samarium (Smo) Metal
Sm (3d) Spectrum – extended range 
 Samarium (Smo) Metal
Peak-fit of Sm (3d) Spectrum (w/o asymm)
   
 


Survey Spectrum of Samarium (Smo) Metal
with Peaks Integrated, Assigned and Labelled
→  Periodic Table 

XPS Signals for Samarium, (Smo) Metal

Spin-Orbit Term,  BE (eV) Value, and Scofield σ for Aluminum Kα X-rays (1486 eV, 8.33 Ang)

Overlaps Spin-Orbit Term BE (eV) Value Scofield σ from 1486 eV X-rays IMFP (TPP-2M) in Å
Sm (3d3/2) 1108 27.96 9.95
Sm (3d5/2) 1082 40.31 1.41
Ca (2p) overlaps Sm (4s) 348 1.42 21.82
Cl (2s) overlaps Sm (4p1/2) 267 1.70 22.98
Sm (4p3/2) 249 3.59 23.25
Sm (3d) 128 9.16 24.94
Sm (5s) 39 0.261 26.23
Sm (5p) 19 0.750 26.47

σ:  abbreviation for the term Scofield Photoionization Cross-Section which is used with IMFP and TF to produce RSF and atom% quantitation

Plasmon Peaks

Energy Loss Peaks

Auger Peaks

 

Energy Loss    Intrinsic Plasmon Peak:  ~xx eV above peak max
Expected Bandgap for Sm2O3: xx  eV
Work Function for Sm:  xx eV
*Scofield Cross-Section (σ) for C (1s) = 1.0

→  Periodic Table 

 

Valence Band Spectra from
Samarium Oxide (Sm2O3) and Samarium Fluoride (SmF3)

Sm2O3 SmF3

 
Overlay of Valence Bands from Sm2O3 and SmF3
C 1s at 285.0 eV

 

 

 

Plasmon Peaks from Smo Metal
 Fresh exposed bulk produced by extensive Ar+ ion etching

Sm (3d) – Extended Range Spectrum Sm (3d) – Extended Range Spectrum – Vertically Zoomed
→  Periodic Table 
 

Sm (LMM) Auger Peaks from Smo Metal
 Fresh exposed bulk produced by extensive Ar+ ion etching
Smo Metal – main Auger peak Smo Metal – full Auger range
 

Features Observed

  • xx
  • xx
  • xx

→  Periodic Table 
 

Artefacts Caused by Argon Ion Etching

C (1s) from Metal Carbide(s)

can form when ion etched Reactive Metal Surfaces capture
Residual UHV Gases (CO, H2O, CH4 etc)

Argon Trapped in Smo

can form when Argon Ions are used
to removed surface contamination
 

Side-by-Side Comparison of
Samarium Fluoride, SmF3 & Samarium Oxide, Sm2O3
Peak-fits, BEs, FWHMs, and Peak Labels
SmF3
Sm (3d) from SmF3 – pressed powder
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV
 Sm2O3
Sm (3d) from Sm2O3 – pressed pellet
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV

  .
SmF3 Sm2O3
C (1s) from SmF3 – pressed powder
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV

C (1s) from Sm2O3 – pressed pellet
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV
→  Periodic Table 
   
SmF3 Sm2O3
F (1s) from SmF3 – pressed powder
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV

O (1s) from Sm2O3 – pressed pellet
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV
→  Periodic Table

 

 

 

Survey Spectrum of Samarium Oxide, Sm2O3
with Peaks Integrated, Assigned and Labelled

 

→  Periodic Table 

 

 


Survey Spectrum of Samarium Fluoride, SmF3
with Peaks Integrated, Assigned and Labelled

→  Periodic Table  

Overlays of Sm (3d) Spectra for
Smo, SmF3, and Sm2O3

Caution: BEs from Grounded Native Oxides can be Misleading if Flood Gun is ON

 Overlay of Smo metal and SmF3 – Sm (3d) BE
C (1s) = 285.0 eV (Flood gun ON
Chemical Shift:  3.3 eV

  Overlay of Smo metal and Sm2O3 – Sm (3d) BE
Pure Oxide C (1s) = 285.0 eV
Chemical Shift:  2.7 eV
→  Periodic Table  Copyright ©:  The XPS Library 

 

Overlay of Sm (3d)
Smo Metal, SmF3, & Sm2O3   

Features Observed

  • xx
  • xx
  • xx

→  Periodic Table 

 

Valence Band Spectra
SmF3, Sm2O3 

SmF3 – pressed powder
 Flood gun is ON,  Charge referenced so C (1s) = 285.0 eV		 Sm2O3 – pressed pellet
Flood gun is ON,  Charge referenced so C (1s) = 285.0 eV

Overlay of Valence Band Spectra for
SmF3 and Sm2O3

Features Observed

  • xx
  • xx
  • xx

→  Periodic Table 

 

Samarium Chemical Compounds

 
Samarium Chloride – SmCl3-6H2O Samarium Sulfate – Sm2(SO4)3 – 8H2O Samarium Iodide – SmI3 Samarium Fluoride – SmF3

→  Periodic Table 

 

Six (6) Chemical State Tables of Sm (3d5/2) BEs

 

  • The XPS Library Spectra-Base
  • PHI Handbook
  • Thermo-Scientific Website
  • XPSfitting Website
  • Techdb Website
  • NIST Website

→  Periodic Table 

 

Notes of Caution when using Published BEs and BE Tables from Insulators and Conductors:

  • Accuracy of Published BEs
    • The accuracy depends on the calibration BEs used to calibrate the energy scale of the instrument.  Cu (2p3/2) BE can vary from 932.2 to 932.8 eV for old publications 
    • Different authors use different BEs for the C (1s) BE of the hydrocarbons found in adventitious carbon that appears on all materials and samples.  From 284.2 to 285.3 eV
    • The accuracy depends on when the authors last checked or adjusted their energy scale to produce the expected calibration BEs
  • Worldwide Differences in Energy Scale Calibrations
    • For various reasons authors still use older energy scale calibrations 
    • Some authors still adjust their energy scale so Cu (2p3/2) appears at 932.2 eV or 932.8 eV because this is what the maker taught them
    • This range causes BEs in the higher BE end to be larger than expected 
    • This variation increases significantly above 600 eV BE
  • Charge Compensation
    • Samples that behave as true insulators normally require the use of a charge neutralizer (electron flood gun with or without Ar+ ions) so that the measured chemical state spectra can be produced without peak-shape distortions or sloping tails on the low BE side of the peak envelop. 
    • Floating all samples (conductive, semi-conductive, and non-conductive) and always using the electron flood gun is considered to produce more reliable BEs and is recommended.
  • Charge Referencing Methods for Insulators
    • Charge referencing is a common method, but it can produce results that are less reliable.
    • When an electron flood gun is used, the BE scale will usually shift to lower BE values by 0.01 to 5.0 eV depending on your voltage setting. Normally, to correct for this flood gun induced shift, the BE of the hydrocarbon C (1s) peak maximum from adventitious carbon is used to correct for the charge induced shift.
    • The hydrocarbon peak is normally the largest peak at the lowest BE. 
    • Depending on your preference or training, the C (1s) BE assigned to this hydrocarbon peak varies from 284.8 to 285.0 eV.  Other BEs can be as low as 284.2 eV or as high as 285.3 eV
    • Native oxides that still show the pure metal can suffer differential charging that causes the C (1s) and the O (1s) and the Metal Oxide BE to be larger
    • When using the electron flood gun, the instrument operator should adjust the voltage and the XY position of the electron flood gun to produce peaks from a strong XPS signal (eg O (1s) or C (1s) having the most narrow FWHM and the lowest experimentally measured BE. 

→  Periodic Table 

Table #1

Sm (3d5/2) Chemical State BEs from:  “The XPS Library Spectra-Base”

C (1s) BE = 285.0 eV for TXL BEs
and C (1s) BE = 284.8 eV for NIST BEs

Element Atomic # Compound As-Measured by TXL or NIST Average BE Largest BE Hydrocarbon C (1s) BE  Source
Sm 62 Sm – element  1080.8 eV Tallest Peak 285.0 eV The XPS Library
Sm 62 Sm-(OH)3 285.0 eV The XPS Library
Sm 62 Sm-2O3  1083.8 eV Tallest Peak 285.0 eV The XPS Library
Sm 62 Sm-acetate 285.0 eV The XPS Library
Sm 62 Sm-CO3 285.0 eV The XPS Library
Sm 62 Sm-F3  1084.5 eV Tallest Peak 285.0 eV The XPS Library

Charge Referencing Notes

  • (N*number) identifies the number of NIST BEs that were averaged to produce the BE in the middle column.
  • The XPS Library uses Binding Energy Scale Calibration with Cu (2p3/2) BE = 932.62 eV and Au (4f7/2) BE = 83.98 eV.  BE (eV) Uncertainty Range:  +/- 0.2 eV
  • Charge Referencing of insulators is defined such that the Adventitious Hydrocarbon C (1s) BE (eV) = 285.0 eV.  NIST uses C (1s) BE = 284.8 eV 
  • Note:   Ion etching removes adventitious carbon, implants Ar (+), changes conductivity of surface, and degrades chemistry of various chemical states.
  • Note:  Ion Etching changes BE of C (1s) hydrocarbon peak.
  • TXL – abbreviation for: “The XPS Library” (https://xpslibrary.com).  NIST:  National Institute for Science and Technology (in USA)

→  Periodic Table 

Table #2

Sm (3d5/2) Chemical State BEs from:  “PHI Handbook”

C (1s) BE = 284.8 eV

→  Periodic Table 

Copyright ©:  Ulvac-PHI

Table #3

Sm (3d5/2) Chemical State BEs from:  “Thermo-Scientific” Website

C (1s) BE = 284.8 eV

 

No BE Table Available

→  Periodic Table 

Copyright ©:  Thermo Scientific 

Table #4

Sm (3d5/2) Chemical State BEs from:  “XPSfitting” Website

Chemical State BE Table derived by Averaging BEs in the NIST XPS database of BEs
C (1s) BE = 284.8 eV

 

No Rare Earth BE Tables Available

→  Periodic Table 

Copyright ©:  Mark Beisinger

Table #5

Sm (435/2) Chemical State BEs from:  “Techdb.podzone.net” Website

 

XPS Spectra – Chemical Shift | Binding Energy
C (1s) BE = 284.6 eV

XPS(X線光電子分光法)スペクトル 化学状態 化学シフト ケミカルシフト

Element Level Compound B.E.(eV) min max
Sm 3d5/2 Sm 1081.2 ±0.3 1080.9 ～ 1081.5
Sm 3d5/2 Sm2O3 1083.5 ±0.3 1083.2 ～ 1083.8

 

→  Periodic Table 

 
 

Histograms of NIST BEs for Sm (4d5/2) BEs

Important Note:  NIST Database defines Adventitious Hydrocarbon C (1s) BE = 284.8 eV for all insulators.

Histogram indicates:  xxxx eV for Smo based on xx literature BEs Histogram indicates:  131.8 eV for Sm2O3 based on 5 literature BEs

Table #6


NIST Database of Sm (4d5/2) and (3d5/2) Binding Energies

NIST Standard Reference Database 20, Version 4.1

Data compiled and evaluated
by
Alexander V. Naumkin, Anna Kraut-Vass, Stephen W. Gaarenstroom, and Cedric J. Powell
©2012 copyright by the U.S. Secretary of Commerce on behalf of the United States of America. All rights reserved.

Important Note:  NIST Database defines Adventitious Hydrocarbon C (1s) BE = 284.8 eV for all insulators.

 

Element Spectral Line Formula Energy (eV) Reference
Sm 4d5/2 Sm2O3 131.00  Click
Sm 4d5/2 Sm2O3 131.00  Click
Sm 4d5/2 Sm2O3 131.20  Click
Sm 4d5/2 SmCrO3 132.20  Click
Sm 4d5/2 Sm2O3 132.80  Click
Sm 4d5/2 Sm2O3 132.80  Click
Sm 4d5/2 Sm2(C2O4)3 132.80  Click
Sm 4d5/2 Sm2(SO4)3 132.90  Click
Sm 3d5/2 Sm 1081.20  Click
Sm 3d5/2 Sm2O3 1084.30  Click
Sm 3d5/2 Sm2O3 1084.30  Click
Sm 3d5/2 Sm2(C2O4)3 1085.50  Click
Sm 3d5/2 Sm2(SO4)3 1085.60  Click

 

 

Statistical Analysis of Binding Energies in NIST XPS Database of BEs

 

 

→  Periodic Table 

 

 

Advanced XPS Information Section

Expert Knowledge, Spectra, Features, Guidance and Cautions
for XPS Research Studies on Samarium Materials

 

 

 

Expert Knowledge Explanations

→  Periodic Table 

 

 

Samarium Chemical Compounds

 

Overlay of Chemical State Spectra

Pure Samarium Metal:  Sm (3d)
Cu (2p3/2) BE = 932.6 eV		 Sm2O3:  Sm (3d)
C (1s) BE = 285.0 eV		 SmF3:  Sm (3d)
C (1s) BE = 285.0 eV

Features Observed

  • xx
  • xx
  • xx

→  Periodic Table 

 

Overlay of Sm (3d) Spectra shown Above

C (1s) BE = 285.0 eV

 

Chemical Shift between Sm and Sm2O3:  2.6 eV
 Chemical Shift between Sm and SmF3:  3.3 eV

 

→  Periodic Table 


Shake-up Features for Sm2O3

 

 

Multiplet Splitting Features
for Samarium Compounds

Smo metal  Sm2O3 

Features Observed

  • xx
  • xx
  • xx

→  Periodic Table 

 

 

 

Samarium Chemical Compounds

 

Survey Spectrum Sm (3d) Spectrum
C (1s) Spectrum F (1s) Spectrum
Valence Band Spectrum

→  Periodic Table 

 

 

Quantitation Details and Information

Quantitation by XPS is often incorrectly done, in many laboratories, by integrating only the main peak, ignoring the Electron Loss peak, and the satellites that appear as much as 30 eV above the main peak.  By ignoring the electron loss peak and the satellites, the accuracy of the atom% quantitation is in error.

When using theoretically calculated Scofield cross-section values, the data must be corrected for the transmission function effect, use the calculated TPP-2M IMFP values, the pass energy effect on the transmission function, and the peak area used for calculation must include the electron loss peak area, shake-up peak area, multiplet-splitting peak area, and satellites that occur within 30 eV of the main peak.

 

Quantitation from Pure, Homogeneous Binary Compound
composed of Samarium – Sm2O3

This section is focused on measuring and reporting the atom % quantitation that results by using:

  • Scofield cross-sections,
  • Spectra corrected to be free from Transmission Function effects
  • A Pass Energy that does not saturate the detector system in the low KE range (BE = 1000-1400 eV)
  • A focused beam of X-ray smaller than the field of view of the lens
  • An angle between the lens and the source that is ~55 deg that negates the effects of beta-asymmetry
  • TPP-2M inelastic mean free path values, and
  • Either a linear background or an iterated Shirley (Sherwood-Proctor) background to define peak areas

The results show here are examples of a method being developed that is expected to improve the “accuracy” or “reliability” of the atom % values produced by XPS.

→  Periodic Table 

 

 

XPS Study of UHV Gas Captured by Freshly Ion Etched Samarium
Reveals Chemical Shifts and Chemical States that Develop from Highly Reactive Pure Smo

Surface was strongly Ar+ ion etched to remove all contaminants, and
then allowed to react overnight with the UHV Gases – CO, H2, H2O, O2 & CH4
that normally reside inside on the walls of the chamber, on the sample stage,
and on the nearby un-etched surface a total of 10-14 hours.  UHV pump was a Cryopump.
Initial spectra are at the front.  Final spectra are at the rear. Flood gun is OFF.
Sm (3d) Signal
  O (1s) Signal C (1s) Signal
 
Copyright ©:  The XPS Library

 

 

Samarium Alloys

   
XxCu XxCu
→  Periodic Table   
XxCu XxCu

 

Copyright ©:  The XPS Library 

 

 

 

XPS Facts, Guidance & Information

→  Periodic Table 

    Element Samarium (Sm)
  
    Primary XPS peak used for Peak-fitting: Sm (3d5/2)  
    Spin-Orbit (S-O) splitting for Primary Peak: Spin-Orbit splitting for “d” Orbital, ΔBE = 26 eV
  
    Binding Energy (BE) of Primary XPS Signal: 1081.1 eV
  
    Scofield Cross-Section (σ) Value: Sm (3d5/2) = 40.37.     Sm (3d3/2) = 27.96
  
    Conductivity: Sm resistivity =  
Native Oxide suffers Differential Charing		  
    Range of Sm (3d5/2) Chemical State BEs: 1080 – 1085 eV range   (Smo to SmF3)  
Signals from other elements that overlap
Sm (3d5/2) Primary Peak:		   xx
Bulk Plasmons:   ~xx eV above peak max for pure
Shake-up Peaks: xx
Multiplet Splitting Peaks:   xx

 

 

 General Information about
XXX Compounds:		   xx  
Cautions – Chemical Poison Warning

xx 

Copyright ©:  The XPS Library 

→  Periodic Table 

 

Information Useful for Peak-fitting Sm (3d5/2)

  • FWHM (eV) of Sm (3d5/2) for Pure Smo :  ~1.8 eV using 25 eV Pass Energy after ion etching:
  • FWHM (eV) of Sm (3d5/2) for Sm2O3:  ~2.7 eV using 50 eV Pass Energy  (before ion etching)
  • Binding Energy (BE) of Primary Signal used for Measuring Chemical State Spectra:  1081.1 eV for Sm (3d5/2) with +/- 0.2 uncertainty
  • List of XPS Peaks that can Overlap Peak-fit results for Sm (3d5/2):  Na (1s)

→  Periodic Table 

 

General Guidelines for Peak-fitting XPS Signals

  • Typical Energy Resolution for Pass Energy (PE) setting used to measure Chemical State Spectra on Various XPS Instruments
    • Ag (3d5/2) FWHM (eV) = ~0.90 eV for PE 50 on Thermo K-Alpha
    • Ag (3d5/2) FWHM (eV) = ~1.00 eV for PE 80 on Kratos Nova
    • Ag (3d5/2) FWHM (eV) = ~0.95 eV for PE 45 on PHI VersaProbe
    • Ag (3d5/2) FWHM (eV) = ~0.85 eV for PE 50 on SSI S-Probe
  • FWHM (eV) of Pure Elements: Ranges from 0.4 to 1.0 eV across the periodic table
  • FWHM of Chemical State Peaks in any Chemical Compound:  Ranges from 1.1 to 1.6 eV  (in rare cases FWHM can be 1.8 to 2.0 eV)
  • FWHM of Pure Element versus FWHM of Oxide:  Pure element FWHM << Oxide FWHM  (e.g. 0.8 vs 1.5 eV, roughly 2x)
  • If FWHM Greater than 1.6 eV:  When a peak FWHM is larger than 1.6 eV, it is best to add another peak to the peak-fit envelop.
  • BE (eV) Difference in Chemical States: The difference in chemical state BEs is typically 1.0-1.3 eV apart.  In rare cases, <0.8 eV.
  • Number of Peaks to Use:  Use minimum. Do not use peaks with FWHM < 1.0 eV unless it is a or a conductive compound.
  • Typical Peak-Shape:  80% G: 20% L,   or Voigt : 1.4 eV Gaussian and 0.5 eV Lorentzian
  • Spin-Orbit Splitting of Two Peaks (due to Coupling):  The ratio of the two (2) peak areas must be constrained.
  • Constraints used on Peak-fitting: typically constrain the peak area ratios based on the Scofield cross-section values
  • Asymmetry for Conductive materials:  20-30% with increased Lorentzian %
  • Peak-fitting “2s” or “3s” Peaks:  Often need to use 50-60% Lorentzian peak-shape

Notes:

  • Other Oxidation States can appear as small peaks when peak-fitting
  • Pure element signals normally have asymmetric tails that should be included in the peak-fit.
  • Gaseous state materials often display asymmetric tails due to vibrational broadening.
  • Peak-fits of C (1s) in polymers include an asymmetric tail when the energy resolution is very high.
  • Binding energy shifts of some compounds are negative due to unusual electron polarization.

→  Periodic Table 

 

 

Contaminants Specific to Samarium

  • Metal develops a thick native oxide due to the reactive nature of clean Metal.
  • The native oxide of SmOx is xx nm thick.
  • Metal thin films often have a low level of iron (Fe) in the bulk as a contaminant or to strengthen the thin film
  • Metal forms a low level of Carbide when the surface is ion etched inside the analysis chamber

 

Commonplace Contaminants

  • Carbon and Oxygen are common contaminants that appear on nearly all surfaces. The amount of Carbon usually depends on handling.
  • Carbon is usually the major contaminant.  The amount of carbon ranges from 5-50 atom%.
  • Carbon contamination is attributed to air-borne organic gases that become trapped by the surface, oils transferred to the surface from packaging containers, static electricity, or handling of the product in the production environment.
  • Carbon contamination is normally a mixture of different chemical states of carbon (hydrocarbon, alcohol or ether, and ester or acid).
  • Hydrocarbon is the dominant form of carbon contamination. It is normally 2-4x larger than the other chemical states of carbon.
  • Carbonate peaks, if they appear, normally appear ~4.5 eV above the hydrocarbon C (1s) peak max BE.
  • Low levels of carbonate is common on many s that readily oxidize in the air.
  • High levels of carbonate appear on reactive oxides and various hydroxides.  This is due to reaction between the oxide and CO2 in the air.
  • Hydroxide contamination peak is due to the reaction with residual water in the lab air or the vacuum.
  • The O (1s) BE of the hydroxide (water) contamination normally appears 0.5 to 1.0 eV above the oxide peak
  • Sodium (Na), Potassium (K), Sulfur (S) and Chlorine (Cl) are common trace to low level contaminants
  • To find low level contaminants it is very useful to vertically expand the 0-600 eV region of the survey spectrum by 5-10X
  • A tiny peak that has 3 or more adjacent data-points above the average noise of the background is considerate to be a real peak
  • Carbides can appear after ion etching various reactive s.  Carbides form due to the residual CO and CH4 in the vacuum.
  • Ion etching can produce low oxidation states of the material being analyzed.  These are newly formed contaminants.
  • Ion etching polymers by using standard Ar+ ion guns will destroy the polymer, converting it into a graphitic type of carbon

→  Periodic Table 

 

Data Collection Guidance

  • Chemical state differentiation can be difficult
  • Collect principal Sm (3d) peak as well as Sm (4d).
  • Long time exposures (high dose) to X-rays can degrade various polymers, catalysts, high oxidation state compounds
  • During XPS analysis, water or solvents can be lost due to high vacuum or irradiation with X-rays or Electron flood gun
  • Auger signals can sometimes be used to discern chemical state shifts when XPS shifts are very small

→  Periodic Table 

 

Data Collection Settings for Samarium (Sm)

  • Conductivity:  Samarium readily develops a native oxide that is sensitive to Flood Gun – Differential Charging Possible – float sample recommended
  • Primary Peak (XPS Signal) used to measure Chemical State Spectra:  Sm (3d5/2) at 1081.1 eV
  • Recommended Pass Energy for Measuring Chemical State Spectrum: 50-100 eV    (Produces Ag (3d5/2) FWHM ~0.7 eV)
  • Recommended # of Scans for Measuring Chemical State Spectrum:  4-5 scans normally   (Use 10-25 scans to improve S/N)
  • Dwell Time:  50 msec/point
  • Step Size:  0.1 eV/point   (0.1 eV/step or 0.1 eV/channel)
  • Standard BE Range for Measuring Chemical State Spectrum:  1065 – 1150 eV
  • Recommended Extended BE Range for Measuring Chemical State Spectrum:  1060 – 1160 eV
  • Recommended BE Range for Survey Spectrum:  -10 to 1,100 eV   (above 1,100 eV there are no useful XPS signals, except for Ge, As and Ga, above 1100 is waste of time)
  • Typical Time for Survey Spectrum:  3-5 minutes for newer instruments, 5-10 minutes for older instruments
  • Typical Time for a single Chemical State Spectrum with high S/N:  5-10 minutes for newer instruments, 10-15 minutes for older instruments 

→  Periodic Table 

 

Effects of Argon Ion Etching

  • Carbides appear after ion etching Sm and various reactive surfaces.  Carbides form due to the presence of residual CO and CH4 in the vacuum.
  • Ion etching can produce low oxidation states of the material being analyzed.  These are newly formed contaminants.
  • Ion etching polymers by using standard Ar+ ion guns will destroy the polymer, converting it into a graphitic type of carbon

 

→  Periodic Table 

Copyright ©:  The XPS Library 
Gas Phase XPS or UPS Spectra

 

Chemical State Spectra from Literature

End of File