Basic XPS Information Section

The Basic XPS Information Section provides fundamental XPS spectra, BE values, FWHM values, BE tables, overlays of key spectra, histograms and a table of XPS parameters.
The Advanced XPS Information Section is a collection of additional spectra, overlays of spectra, peak-fit advice, data collection guidance, material info,
common contaminants, degradation during analysis, auto-oxidation, gas capture study, valence band spectra, Auger spectra, and more.
Published literature references, and website links are summarized at the end of the advanced section.
 Periodic Table – HomePage                      XPS Database of Polymers                   → Six (6) BE Tables



Tellurium (Te)

 

Tellurite – TeO2 Tellurium – Teo Calaverite – AuTe2

 

Page Index
  • Pure Element Spectra with Peak-fits
  • IMFP and Cross-sections for Pure Element
  • Native Oxide Spectra with Peak-fits
  • Pure Oxide Spectra with Peak-fits
  • Overlays and Valence Band Spectra
  • Six (6) Tables of Chemical State BEs 
  • Histograms of NIST BEs
  • Advanced XPS Information Section
  • Peak-fits and Overlays of Te Chemical Compounds
  • Quantitation and Atom %s
  • Flood Gun Effects on Native Oxide Spectra
  • Study of UHV Gas Capture after Cleaning
  • Auger Peaks and Spectra
  • Contamination
  • XPS Facts, Guidance, Information
  • Chemical State Spectra from Literature
  • Expert Knowledge Explanations


Tellurium (Teo) Metalloid

Peak-fits, BEs, FWHMs, and Peak Labels


.
Tellurium (Teo) Metalloid
Te (3d) Spectrum – raw spectrum

ion etched clean
Tellurium (Teo) Metalloid
Peak-fit of Te (3d) Spectrum
(w/o asymm)


 Periodic Table – HomePage  
Tellurium (Teo) Metalloid
Te (3d) Spectrum – extended range 
Tellurium (Teo) Metalloid
Peak-fit of Te (3d) Spectrum (w asymm)
   

 


Survey Spectrum of Tellurium (Te
o) Metalloid
with Peaks Integrated, Assigned and Labelled

 


 Periodic Table 

XPS Signals for Tellurium, (Teo) Metalloid

Spin-Orbit Term,  BE (eV) Value, and Scofield σ for Aluminum Kα X-rays (1486 eV, 8.33 Ang)

Overlaps Spin-Orbit Term BE (eV) Value Scofield σ from 1486 eV X-rays IMFP (TPP-2M) in Å
Te (3s) 1004 3.46 12.9
Te (3p1/2) 871 4.92 16.3
Te (3p3/2) 820 10.21 16.3
Te (3d3/2) 583.29 12.52 20.5
Cr (2p) & Ag (3p) overlap Te (3d5/2) 572.90 18.06 20.5
S (2p) overlaps Te (4s) 169 0.903 27.2
Te (4p) 111 3.11 28.1
As (3d) overlaps Te (4d) 41 3.63

σ:  abbreviation for the term Scofield Photoionization Cross-Section used with IMFP and Transmission Function to produce Atom%s

*Scofield Cross-Section (σ) for C (1s) = 1.0

Plasmon Peaks

Energy Loss Peaks

Auger Peaks

Energy Loss    Intrinsic Plasmon Peak:  ~xx eV above peak max
Expected Bandgap for TeO2: 2.23 eV   (https://materialsproject.org/materials/mp-2125)
Work Function for Te:  xx eV

 Periodic Table 


 

Valence Band Spectrum fromTellerium, Teo Metalloid
 Fresh exposed bulk produced by extensive Ar+ ion etching

 


 

Plasmon Peaks from Teo Metalloid
 Fresh exposed bulk produced by extensive Ar+ ion etching

Te (3d) – Extended Range Spectrum Te (3d) – Extended Range Spectrum – Vertically Zoomed
 Periodic Table 

 

Te (LMM) Auger Peaks from Teo Metalloid
 Fresh exposed bulk produced by extensive Ar+ ion etching

Teo metalloid – main Auger peaks Teo metalloid – full Auger range
 

Features Observed

  • xx
  • xx
  • xx

 Periodic Table 


 

Example of Breakdown in One-Electron Orbital Concept
in Elements Z=46 (Palladium) to Z= 59 (Praseodymium)

Rhodium (4s) and (4p) Peakshapes Tellurium (4s) and (4p) Peakshapes Praseodymium (4s) and (4p) Peakshapes

Reference:
G. Wendin, Breakdown of One-Electron Pictures in Photoelectron Spectra, Structure and Bonding Series #45, Springer-Verlag, New York, 1981

 


 

Artefacts Caused by Argon Ion Etching

C (1s) from Metal Carbide(s)

can form when ion etched Reactive Metal Surfaces capture
Residual UHV Gases (CO, H2O, CH4 etc)

Argon Trapped in Teo

can form when Argon Ions are used
to removed surface contamination


 

Side-by-Side Comparison of
Te Native Oxide & Tellurium Oxide (TeO2)
Peak-fits, BEs, FWHMs, and Peak Labels

Te Native Oxide TeO2
Te (3d) from Te Native Oxide
Flood Gun OFF
As-Measured, C (1s) at 285.1 eV
Te (3d) from TeO2 – pressed pellet
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV
 


.
C (1s) from Te Native Oxide
As-Measured, C (1s) at 285.1 eV
Flood Gun OFF

C (1s) from TeO2 – pressed pellet
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV

 
 Periodic Table 

.
O (1s) from Te Native Oxide
As-Measured, C (1s) at 285.1 eV
Flood Gun OFF

O (1s) from TeO2 – pressed pellet
Flood Gun ON
Charge Referenced to C (1s) at 285.0 eV

 Periodic Table

 


 

Survey Spectrum of Tellurium (Te) Native Oxide
with Peaks Integrated, Assigned and Labelled

 

 Periodic Table 


 

 

Survey Spectrum of Tellurium Oxide, TeO2
with Peaks Integrated, Assigned and Labelled

 Periodic Table  


Overlays of Te (3d) Spectra for
Te Native Oxide and TeO2

Caution: BEs from Grounded Native Oxides can be Misleading if Flood Gun is ON

 

 Overlay of Teo metalloid and Te Native Oxide – Te (3d)
Native Oxide C (1s) = 285.1 eV (Flood gun OFF)

 Overlay of Teo metalloid and TeO2 – Te (3d)
Pure Oxide C (1s) = 285.0 eV
Chemical Shift: 3.8 eV
 Periodic Table  Copyright ©:  The XPS Library 

 

Overlay of Te (3d)
Teo Metalloid, Te Native Oxide, & TeO2

Features Observed

  • xx
  • xx
  • xx

 Periodic Table 


 

Valence Band Spectra
Teo, TeO

Teo
Ion etched clean
TeO2 – pressed pellet
Flood gun is ON,  Charge referenced so C (1s) = 285.0 eV


Overlay of Valence Band Spectra
for Teo metalloid and TeO2

Features Observed

  • xx
  • xx
  • xx

 Periodic Table 



 

Tellurium Minerals, Gemstones, and Chemical Compounds

 

Winstanleyite – TiTe3O8 Hessite – Ag2Te Wildcatite – CaFeTeO5(OH) Utahite – MgCu4Zn2Te3O14(OH)4 · 6H2O

 Periodic Table 



 

Six (6) Chemical State Tables of Te (3d5/2) BEs

 

  • The XPS Library Spectra-Base
  • PHI Handbook
  • Thermo-Scientific Website
  • XPSfitting Website
  • Techdb Website
  • NIST Website

 Periodic Table 



 

Notes of Caution when using Published BEs and BE Tables from Insulators and Conductors:

  • Accuracy of Published BEs
    • The accuracy depends on the calibration BEs used to calibrate the energy scale of the instrument.  Cu (2p3/2) BE can vary from 932.2 to 932.8 eV for old publications 
    • Different authors use different BEs for the C (1s) BE of the hydrocarbons found in adventitious carbon that appears on all materials and samples.  From 284.2 to 285.3 eV
    • The accuracy depends on when the authors last checked or adjusted their energy scale to produce the expected calibration BEs
  • Worldwide Differences in Energy Scale Calibrations
    • For various reasons authors still use older energy scale calibrations 
    • Some authors still adjust their energy scale so Cu (2p3/2) appears at 932.2 eV or 932.8 eV because this is what the maker taught them
    • This range causes BEs in the higher BE end to be larger than expected 
    • This variation increases significantly above 600 eV BE
  • Charge Compensation
    • Samples that behave as true insulators normally require the use of a charge neutralizer (electron flood gun with or without Ar+ ions) so that the measured chemical state spectra can be produced without peak-shape distortions or sloping tails on the low BE side of the peak envelop. 
    • Floating all samples (conductive, semi-conductive, and non-conductive) and always using the electron flood gun is considered to produce more reliable BEs and is recommended.
  • Charge Referencing Methods for Insulators
    • Charge referencing is a common method, but it can produce results that are less reliable.
    • When an electron flood gun is used, the BE scale will usually shift to lower BE values by 0.01 to 5.0 eV depending on your voltage setting. Normally, to correct for this flood gun induced shift, the BE of the hydrocarbon C (1s) peak maximum from adventitious carbon is used to correct for the charge induced shift.
    • The hydrocarbon peak is normally the largest peak at the lowest BE. 
    • Depending on your preference or training, the C (1s) BE assigned to this hydrocarbon peak varies from 284.8 to 285.0 eV.  Other BEs can be as low as 284.2 eV or as high as 285.3 eV
    • Native oxides that still show the pure metal can suffer differential charging that causes the C (1s) and the O (1s) and the Metal Oxide BE to be larger
    • When using the electron flood gun, the instrument operator should adjust the voltage and the XY position of the electron flood gun to produce peaks from a strong XPS signal (eg O (1s) or C (1s) having the most narrow FWHM and the lowest experimentally measured BE. 

 Periodic Table 


Table #1

Te (3d5/2) Chemical State BEs from:  “The XPS Library Spectra-base”

C (1s) BE = 285.0 eV for TXL BEs
and C (1s) BE = 284.8 eV for NIST BEs

Element Atomic # Compound As-Measured by TXL or NIST Average BE Largest BE Hydrocarbon C (1s) BE  Source
Te 52 ZnTe (N*2) 571.5 eV 572.9 eV 284.8 eV Avg BE – NIST
Te 52 PbTe (N*2) 572.0 eV 572.2 eV 284.8 eV Avg BE – NIST
Te 52 PbTe 572.3 eV 285.0 eV The XPS Library
Te 52 CdTe (N*10) 572.3 eV 572.9 eV 284.8 eV Avg BE – NIST
Te 52 HgCdTe (N*1) 572.3 eV 284.8 eV Avg BE – NIST
Te 52 Cd-Te 572.4 eV 572.6 eV 285.0 eV The XPS Library
Te 52 Ag-Te 572.5 eV 285.0 eV The XPS Library
Te 52 Cs2.6Te (N*2) 572.5 eV 574.2 eV 284.8 eV Avg BE – NIST
Te 52 Te-Sb 572.5 eV 573.1 eV 285.0 eV The XPS Library
Te 52 Te (N*19) 572.7 eV 572.5 eV 284.8 eV Avg BE – NIST
Te 52 Te – element 572.9 eV 285.0 eV The XPS Library
Te 52 HgTe 573.2 eV 285.0 eV The XPS Library
Te 52 HgCdTe 573.3 eV 285.0 eV The XPS Library
Te 52 TeO2 (N*6) 575.6 eV 576.5 eV 284.8 eV Avg BE – NIST
Te 52 TeI4 (N*1) 575.8 eV 284.8 eV Avg BE – NIST
Te 52 Te-O2 576.6 eV 285.0 eV The XPS Library
Te 52 TeO3 (N*2) 576.6 eV 577.3 eV 284.8 eV Avg BE – NIST
Te 52 TeCl4 (N*1) 576.9 eV 284.8 eV Avg BE – NIST
Te 52 Te-(OH)6 (N*1) 577.1 eV 284.8 eV Avg BE – NIST

Charge Referencing Notes

  • (N*number) identifies the number of NIST BEs that were averaged to produce the BE in the middle column.
  • The XPS Library uses Binding Energy Scale Calibration with Cu (2p3/2) BE = 932.62 eV and Au (3d7/2) BE = 83.98 eV.  BE (eV) Uncertainty Range:  +/- 0.2 eV
  • Charge Referencing of insulators is defined such that the Adventitious Hydrocarbon C (1s) BE (eV) = 285.0 eV.  NIST uses C (1s) BE = 284.8 eV 
  • Note:   Ion etching removes adventitious carbon, implants Ar (+), changes conductivity of surface, and degrades chemistry of various chemical states.
  • Note:  Ion Etching changes BE of C (1s) hydrocarbon peak.
  • TXL – abbreviation for: “The XPS Library” (https://xpslibrary.com).  NIST:  National Institute for Science and Technology (in USA)

 Periodic Table 


Table #2

Te (3d5/2) Chemical State BEs from:  “PHI Handbook”

C (1s) BE = 284.8 eV

 Periodic Table 

Copyright ©:  Ulvac-PHI


Table #3

Te (3d5/2) Chemical State BEs from:  “Thermo-Scientific” Website

C (1s) BE = 284.8 eV

Chemical state Binding energy (eV), Te (3d5/2)
Te metal 573.0
Te oxide 576.3

 Periodic Table 

Copyright ©:  Thermo Scientific 


Table #4

Te (3d5/2) Chemical State BEs from:  “XPSfitting” Website

Chemical State BE Table derived by Averaging BEs in the NIST XPS database of BEs
C (1s) BE = 284.8 eV

 Periodic Table 

Copyright ©:  Mark Beisinger


Table #5

Te (3d5/2) Chemical State BEs from:  “Techdb.podzone.net” Website

 

XPS Spectra – Chemical Shift | Binding Energy
C (1s) BE = 284.6 eV

XPS(X線光電子分光法)スペクトル 化学状態 化学シフト ケミカルシフト

Element Level Compound B.E.(eV) min max
Te 3d5/2 CdTe 572.3 ±0.3 572.0 572.5
Te 3d5/2 Hg0.8Cd0.2Te 572.3 ±0.3 572.0 572.5
Te 3d5/2 Tellurides 572.5 ±0.3 572.2 572.8
Te 3d5/2 GeTe 572.8 ±0.3 572.5 573.0
Te 3d5/2 Te 573.0 ±0.3 572.7 573.3
Te 3d5/2 Ph2Te2 574.0 ±0.2 573.8 574.2
Te 3d5/2 TeO2 575.8 ±0.3 575.5 576.0
Te 3d5/2 Halides 576.3 ±0.6 575.7 576.8
Te 3d5/2 Br3TePh 576.6 ±0.3 576.3 576.9
Te 3d5/2 TeO3 576.7 ±0.3 576.4 576.9
Te 3d5/2 Te(OH)6 577.1 ±0.2 576.9 577.3

 Periodic Table 



 


Histograms of NIST BEs for Te (3d
5/2) BEs

Important Note:  NIST Database defines Adventitious Hydrocarbon C (1s) BE = 284.8 eV for all insulators.

Histogram indicates:  573.0 eV for Teo based on 20 literature BEs Histogram indicates:  576.1 eV for TeO2 based on 6 literature BEs

Histogram indicates:  572.6 eV for CdTe based on 10 literature BEs

Table #6


NIST Database of Te (3d5/2) Binding
Energies

NIST Standard Reference Database 20, Version 4.1

Data compiled and evaluated
by
Alexander V. Naumkin, Anna Kraut-Vass, Stephen W. Gaarenstroom, and Cedric J. Powell
©2012 copyright by the U.S. Secretary of Commerce on behalf of the United States of America. All rights reserved.

Important Note:  NIST Database defines Adventitious Hydrocarbon C (1s) BE = 284.8 eV for all insulators.

 

Element Spectral Line Formula Energy (eV) Reference
Te 3d5/2 (Ag2O)0.50(TeO2)0.10(P2O5)0.40 571.10  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.25(P2O5)0.25 571.20  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.35(P2O5)0.15 571.20  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.45(P2O5)0.05 571.20  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.30(P2O5)0.20 571.30  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.40(P2O5)0.10 571.40  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.15(P2O5)0.35 571.40  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.20(P2O5)0.30 571.40  Click
Te 3d5/2 ZnTe 571.50  Click
Te 3d5/2 (Ag2O)0.5(TeO2)0.5 571.50  Click
Te 3d5/2 PbTe 571.70  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.05(P2O5)0.45 571.90  Click
Te 3d5/2 PbTe 572.00  Click
Te 3d5/2 PbInTe 572.00  Click
Te 3d5/2 (Ag2O)0.3(TeO2)0.7 572.00  Click
Te 3d5/2 Te 572.10  Click
Te 3d5/2 Na2Te 572.20  Click
Te 3d5/2 PbTe 572.20  Click
Te 3d5/2 MnTe 572.20  Click
Te 3d5/2 GaMo4S4Te4 572.20  Click
Te 3d5/2 CdTe 572.26  Click
Te 3d5/2 CdTe 572.30  Click
Te 3d5/2 Cd0.2Hg0.8Te 572.30  Click
Te 3d5/2 SnTe 572.30  Click
Te 3d5/2 Pb0.98Mn0.02Te 572.30  Click
Te 3d5/2 Pb0.96Mn0.04Te 572.30  Click
Te 3d5/2 InTe 572.30  Click
Te 3d5/2 Ga2Te3 572.40  Click
Te 3d5/2 Pb0.92Mn0.08Te 572.40  Click
Te 3d5/2 In2Te3 572.40  Click
Te 3d5/2 CdTe 572.47  Click
Te 3d5/2 CdTe 572.47  Click
Te 3d5/2 Cs0.90Te 572.47  Click
Te 3d5/2 Cs2.6Te 572.48  Click
Te 3d5/2 CdTe 572.50  Click
Te 3d5/2 CdTe 572.50  Click
Te 3d5/2 GeTe3As2 572.50  Click
Te 3d5/2 Pb0.94Mn0.06Te 572.50  Click
Te 3d5/2 CdTe 572.52  Click
Te 3d5/2 Cs0.78Te 572.53  Click
Te 3d5/2 GeTeAs2S2 572.55  Click
Te 3d5/2 CdSe0.65Te0.35 572.60  Click
Te 3d5/2 CdTe 572.60  Click
Te 3d5/2 Nb3Te4 572.60  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.45(P2O5)0.05 572.60  Click
Te 3d5/2 CdTe 572.70  Click
Te 3d5/2 GeTe 572.70  Click
Te 3d5/2 Te 572.70  Click
Te 3d5/2 Te 572.70  Click
Te 3d5/2 Te 572.70  Click
Te 3d5/2 Cd0.65Zn0.35TeOx 572.70  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.40(P2O5)0.10 572.70  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.35(P2O5)0.15 572.70  Click
Te 3d5/2 Cs2.4Te 572.72  Click
Te 3d5/2 Cs2.69Te 572.72  Click
Te 3d5/2 GeTe2 572.75  Click
Te 3d5/2 NbTe4 572.80  Click
Te 3d5/2 Te/Si 572.80  Click
Te 3d5/2 Te/Si 572.80  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.25(P2O5)0.25 572.80  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.30(P2O5)0.20 572.80  Click
Te 3d5/2 Te 572.85  Click
Te 3d5/2 Te 572.85  Click
Te 3d5/2 CdTe 572.90  Click
Te 3d5/2 Te 572.90  Click
Te 3d5/2 Te 572.90  Click
Te 3d5/2 Te 572.90  Click
Te 3d5/2 Te 572.90  Click
Te 3d5/2 U2Te3 572.90  Click
Te 3d5/2 ZnTe 572.90  Click
Te 3d5/2 (Ag2O)0.5(TeO2)0.5 572.90  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.10(P2O5)0.40 572.90  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.20(P2O5)0.30 572.90  Click
Te 3d5/2 CdTe 572.98  Click
Te 3d5/2 Te 572.98  Click
Te 3d5/2 Te 572.99  Click
Te 3d5/2 Te 573.00  Click
Te 3d5/2 UTe3 573.00  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.15(P2O5)0.35 573.00  Click
Te 3d5/2 Te 573.05  Click
Te 3d5/2 Cs/Te 573.05  Click
Te 3d5/2 Te 573.10  Click
Te 3d5/2 Te 573.10  Click
Te 3d5/2 Te 573.20  Click
Te 3d5/2 [C26H24NOTe][BF4] 573.30  Click
Te 3d5/2 Te 573.40  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.05(P2O5)0.45 573.40  Click
Te 3d5/2 Te 573.50  Click
Te 3d5/2 Te 573.54  Click
Te 3d5/2 Te 573.54  Click
Te 3d5/2 C26H18Te2.C60.CS2 573.80  Click
Te 3d5/2 (Ag2O)0.1(TeO2)0.9 573.80  Click
Te 3d5/2 [Te2(C6H5)2] 573.90  Click
Te 3d5/2 C13H21Te 573.90  Click
Te 3d5/2 C26H40Te2 574.00  Click
Te 3d5/2 [Te(CH2P(C6H5)3)4]Cl4 574.10  Click
Te 3d5/2 [((C6H5)3P=CH2)4Te]Cl4 574.10  Click
Te 3d5/2 C14H17Te 574.10  Click
Te 3d5/2 [((C6H5)3P=CH2)2TeCl2]Cl2 574.20  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.40(P2O5)0.10 574.20  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.20(P2O5)0.30 574.20  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.30(P2O5)0.20 574.20  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.35(P2O5)0.15 574.20  Click
Te 3d5/2 Cs2.6Te 574.25  Click
Te 3d5/2 [TeCl(CH2P(C6H5)3)3]Cl3 574.30  Click
Te 3d5/2 Cs2.69Te 574.30  Click
Te 3d5/2 [((C6H5)3P=CH2)3TeCl]Cl3 574.30  Click
Te 3d5/2 [C21H24NTe][BF4] 574.30  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.45(P2O5)0.05 574.30  Click
Te 3d5/2 (Ag2O)0.5(TeO2)0.5 574.40  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.10(P2O5)0.40 574.40  Click
Te 3d5/2 [TeCl2(CH2P(C6H5)3)2]Cl2 574.50  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.15(P2O5)0.35 574.50  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.25(P2O5)0.25 574.60  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.05(P2O5)0.45 574.90  Click
Te 3d5/2 (Ag2O)0.3(TeO2)0.7 575.10  Click
Te 3d5/2 [TeI2(C2H5)2] 575.30  Click
Te 3d5/2 [TeI2(C6H5)2] 575.40  Click
Te 3d5/2 K2TeO3 575.50  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.45(P2O5)0.05 575.50  Click
Te 3d5/2 [TeI2(CH3)2] 575.60  Click
Te 3d5/2 TeO2 575.60  Click
Te 3d5/2 TeO2 575.60  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.40(P2O5)0.10 575.60  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.35(P2O5)0.15 575.70  Click
Te 3d5/2 [TeI3C6H5] 575.80  Click
Te 3d5/2 TeO2 575.80  Click
Te 3d5/2 TeO2 575.80  Click
Te 3d5/2 TeI4 575.80  Click
Te 3d5/2 [((C6H5)3P=CH2)4Te]Cl4 575.80  Click
Te 3d5/2 Cd0.65Zn0.35TeOx 575.90  Click
Te 3d5/2 [((C6H5)3P=CH2)3TeCl]Cl3 575.90  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.30(P2O5)0.20 575.90  Click
Te 3d5/2 [TeBr2(C6H5CH3)] 576.00  Click
Te 3d5/2 C14H17Br2OTe 576.00  Click
Te 3d5/2 (Ag2O)0.5(TeO2)0.5 576.00  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.25(P2O5)0.25 576.00  Click
Te 3d5/2 [Te(OOH)C6H4CH3] 576.10  Click
Te 3d5/2 TeO2 576.10  Click
Te 3d5/2 TeO2 576.10  Click
Te 3d5/2 TeO2 576.10  Click
Te 3d5/2 TeO2 576.10  Click
Te 3d5/2 Hg0.7Cd0.3TeOx 576.10  Click
Te 3d5/2 [TeBr2(C6H5)2] 576.20  Click
Te 3d5/2 [TeCl2(C6H5)2] 576.20  Click
Te 3d5/2 (Ag2O)0.1(TeO2)0.9 576.20  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.20(P2O5)0.30 576.20  Click
Te 3d5/2 TeO2 576.21  Click
Te 3d5/2 TeO2 576.21  Click
Te 3d5/2 [TeCl4((CH3)2NCSN(CH3)2)2] 576.30  Click
Te 3d5/2 CdTeO3 576.30  Click
Te 3d5/2 C14Cl2H17Te 576.30  Click
Te 3d5/2 TeO2 576.40  Click
Te 3d5/2 TeO2 576.40  Click
Te 3d5/2 C14Cl2H16O2Te 576.40  Click
Te 3d5/2 (Ag2O)0.3(TeO2)0.7 576.40  Click
Te 3d5/2 (NH4)2TeO4 576.50  Click
Te 3d5/2 TeO2 576.50  Click
Te 3d5/2 TeO2 576.50  Click
Te 3d5/2 [((C6H5)3P=CH2)2TeCl2]Cl2 576.50  Click
Te 3d5/2 [TeBr3(C4H9)] 576.60  Click
Te 3d5/2 [TeBr3C6H5] 576.60  Click
Te 3d5/2 TeO3 576.60  Click
Te 3d5/2 (MoO3)23.75(TeO2)5(V2O5)71.25 576.60  Click
Te 3d5/2 (MoO3)22.5(TeO2)10(V2O5)67.5 576.60  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.10(P2O5)0.40 576.60  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.15(P2O5)0.35 576.60  Click
Te 3d5/2 [TeCl3(C6H4OCH3)] 576.70  Click
Te 3d5/2 TeBr4 576.70  Click
Te 3d5/2 Na2TeO4 576.80  Click
Te 3d5/2 TeCl4 576.90  Click
Te 3d5/2 (NH4)2[TeCl6] 576.90  Click
Te 3d5/2 Te(OH)6 577.10  Click
Te 3d5/2 TeO3 577.30  Click
Te 3d5/2 (Ag2O)0.50(TeO2)0.05(P2O5)0.45 577.40  Click

 

 

Statistical Analysis of Binding Energies in NIST XPS Database of BEs

 

 

 Periodic Table 


 

Advanced XPS Information Section

Expert Knowledge, Spectra, Features, Guidance and Cautions
for XPS Research Studies on Tellurium Materials

 


 

Expert Knowledge Explanations

 Periodic Table 


 

 

Tellurium Chemical Compounds

 

Peak-fits and Overlays of Chemical State Spectra

Pure Tellurium, Teo:  Te (3d)
Cu (2p3/2) BE = 932.6 eV
TeO2:  Te (3d)
C (1s) BE = 285.0 eV
CdTe:  Te (3d)
C (1s) BE = 285.0 eV

Features Observed

  • xx
  • xx
  • xx

 Periodic Table 


 

Overlay of Te (3d) Spectra shown Above

C (1s) BE = 285.0 eV

 

Chemical Shift between Te and TeO2:  +3.7 eV
 Chemical Shift between Te and CdTe:  -0.5 eV

 

 Periodic Table 


 

Tellurium Oxide (TeO2)
pressed pellet

Survey Spectrum from TeO2
Flood gun is ON, C (1s) BE = 285.0 eV
Te (3d) Chemical State Spectrum from TeO2
Flood gun is ON, C (1s) BE = 285.0 eV

.
O (1s) Chemical State Spectrum from TeO2
Flood gun is ON, C (1s) BE = 285.0 eV
C (1s) Chemical State Spectrum from TeO2
Flood gun is ON, C (1s) BE = 285.0 eV

.
Valence Band Spectrum from TeO2
Flood gun is ON, C (1s) BE = 285.0 eV

Auger Signals from TeO2
Flood gun is ON, C (1s) BE = 285.0 eV

na



Shake-up Features for TeO2

 


 

Multiplet Splitting Features for Metal Compounds

Te metal – NO Splitting for Te (4s) TeO2  – Multiplet Splitting Peaks for Te (4s)

 

 

Features Observed

  • xx
  • xx
  • xx

 Periodic Table 

 


 

Telluride Chemical Compounds

 

Cadmium Telluride, CdTe
as received, Flood Gun OFF

Survey Spectrum Te (3d) Spectrum


  .
C (1s) Spectrum Cd (3d) Spectrum

.
O (1s) Spectrum

 

Lead Telluride, PbTe
as received, Flood Gun OFF, conductive

Survey Spectrum Te (3d) Spectrum


.
C (1s) Spectrum Pb (4f) Spectrum


.
Valence Band Spectrum O (1s) Spectrum

Silver Telluride, AgTe
As Received, Flood Gun OFF, conductive

Survey Spectrum Te (3d) Spectrum


.
C (1s) Spectrum Ag (3d) Spectrum


 
Valence Band Spectrum O (1s) Spectrum

 Periodic Table 

 



 

Quantitation Details and Information

Quantitation by XPS is often incorrectly done, in many laboratories, by integrating only the main peak, ignoring the Electron Loss peak, and the satellites that appear as much as 30 eV above the main peak.  By ignoring the electron loss peak and the satellites, the accuracy of the atom% quantitation is in error.

When using theoretically calculated Scofield cross-section values, the data must be corrected for the transmission function effect, use the calculated TPP-2M IMFP values, the pass energy effect on the transmission function, and the peak area used for calculation must include the electron loss peak area, shake-up peak area, multiplet-splitting peak area, and satellites that occur within 30 eV of the main peak.

 

Quantitation from Pure, Homogeneous Binary Compound
composed of Tellurium – TeO2

This section is focused on measuring and reporting the atom % quantitation that results by using:

  • Scofield cross-sections,
  • Spectra corrected to be free from Transmission Function effects
  • A Pass Energy that does not saturate the detector system in the low KE range (BE = 1000-1400 eV)
  • A focused beam of X-ray smaller than the field of view of the lens
  • An angle between the lens and the source that is ~55 deg that negates the effects of beta-asymmetry
  • TPP-2M inelastic mean free path values, and
  • Either a linear background or an iterated Shirley (Sherwood-Proctor) background to define peak areas

The results show here are examples of a method being developed that is expected to improve the “accuracy” or “reliability” of the atom % values produced by XPS.

 Periodic Table 

 


 

 

Flood Gun Effect on Native Oxide of Tellurium

 

Native Oxide of Metal Sheet – Sample GROUNDED

 


 

Native Oxide of Metal Sheet – Sample Grounded

Electron Flood Gun:  0 Voltage (FG OFF), Min Voltage versus Max Voltage

Te (3d) O (1s) C (1s)
 Periodic Table 

 

 

XPS Study of UHV Gas Captured by Freshly Ion Etched Tellurium
Reveals Chemical Shifts and Chemical States that Develop from Highly Reactive Pure Teo

Surface was strongly Ar+ ion etched to remove all contaminants, and
then allowed to react overnight with the UHV Gases – CO, H2, H2O, O2 & CH4
that normally reside inside on the walls of the chamber, on the sample stage,
and on the nearby un-etched surface a total of 10-14 hours.  UHV pump was a Cryopump.
Initial spectra are at the front.  Final spectra are at the rear. Flood gun is OFF.
Te (3d) Signal
 O (1s) Signal C (1s) Signal
Copyright ©:  The XPS Library

 

 

Tellurium Alloys

   
XxCu XxCu
 Periodic Table   
XxCu XxCu

 

Copyright ©:  The XPS Library 

 



 

XPS Facts, Guidance & Information

 Periodic Table 

    Element Tellurium (Te)
 
    Primary XPS peak used for Peak-fitting: Te (3d5/2)  
    Spin-Orbit (S-O) splitting for Primary Peak: Spin-Orbit splitting for “d” Orbital, ΔBE = 10.4 eV
 
    Binding Energy (BE) of Primary XPS Signal: 572.9 eV
 
    Scofield Cross-Section (σ) Value: Te (3d5/2) = 18.06.     Te (3d3/2) = 12.52
 
    Conductivity: Te resistivity =  
Native Oxide suffers Differential Charing
 
    Range of Te (3d5/2) Chemical State BEs: 571-576 eV range   (Teo to TeF4)  
Signals from other elements that overlap
Te (3d5/2) Primary Peak:
  Cr (2p)
Bulk Plasmons:   ~xx eV above peak max for pure
Shake-up Peaks: xx
Multiplet Splitting Peaks:   xx

 

 

General Information about
XXX Compounds:
  xx  
Cautions – Chemical Poison Warning

xx 

Copyright ©:  The XPS Library 

 Periodic Table 



 

Information Useful for Peak-fitting Te (3d5/2)

  • FWHM (eV) of Te (3d5/2) for Pure Teo ~0.8 eV using 25 eV Pass Energy after ion etching:
  • FWHM (eV) of Te (3d5/2) for TeO2 ~1.5 eV using 50 eV Pass Energy  (before ion etching)
  • Binding Energy (BE) of Primary Signal used for Measuring Chemical State Spectra:  572.9 eV for Te (3d5/2) with +/- 0.2 uncertainty
  • List of XPS Peaks that can Overlap Peak-fit results for Te (3d5/2):  Cr (2p3)

 Periodic Table 


 

General Guidelines for Peak-fitting XPS Signals

  • Typical Energy Resolution for Pass Energy (PE) setting used to measure Chemical State Spectra on Various XPS Instruments
    • Ag (3d5/2) FWHM (eV) = ~0.90 eV for PE 50 on Thermo K-Alpha
    • Ag (3d5/2) FWHM (eV) = ~1.00 eV for PE 80 on Kratos Nova
    • Ag (3d5/2) FWHM (eV) = ~0.95 eV for PE 45 on PHI VersaProbe
    • Ag (3d5/2) FWHM (eV) = ~0.85 eV for PE 50 on SSI S-Probe
  • FWHM (eV) of Pure Elements: Ranges from 0.4 to 1.0 eV across the periodic table
  • FWHM of Chemical State Peaks in any Chemical Compound:  Ranges from 1.1 to 1.6 eV  (in rare cases FWHM can be 1.8 to 2.0 eV)
  • FWHM of Pure Element versus FWHM of Oxide:  Pure element FWHM << Oxide FWHM  (e.g. 0.8 vs 1.5 eV, roughly 2x)
  • If FWHM Greater than 1.6 eV:  When a peak FWHM is larger than 1.6 eV, it is best to add another peak to the peak-fit envelop.
  • BE (eV) Difference in Chemical States: The difference in chemical state BEs is typically 1.0-1.3 eV apart.  In rare cases, <0.8 eV.
  • Number of Peaks to Use:  Use minimum. Do not use peaks with FWHM < 1.0 eV unless it is a or a conductive compound.
  • Typical Peak-Shape:  80% G: 20% L,   or Voigt : 1.4 eV Gaussian and 0.5 eV Lorentzian
  • Spin-Orbit Splitting of Two Peaks (due to Coupling):  The ratio of the two (2) peak areas must be constrained.
  • Constraints used on Peak-fitting: typically constrain the peak area ratios based on the Scofield cross-section values
  • Asymmetry for Conductive materials:  20-30% with increased Lorentzian %
  • Peak-fitting “2s” or “3s” Peaks:  Often need to use 50-60% Lorentzian peak-shape

Notes:

  • Other Oxidation States can appear as small peaks when peak-fitting
  • Pure element signals normally have asymmetric tails that should be included in the peak-fit.
  • Gaseous state materials often display asymmetric tails due to vibrational broadening.
  • Peak-fits of C (1s) in polymers include an asymmetric tail when the energy resolution is very high.
  • Binding energy shifts of some compounds are negative due to unusual electron polarization.

 Periodic Table 


 

Contaminants Specific to Tellurium

  • Tellurium develops a thick native oxide due to the reactive nature of clean Tellurium .
  • The native oxide of Te Ox is 7-9 nm thick.
  • Tellurium thin films often have a low level of iron (Fe) in the bulk as a contaminant or to strengthen the thin film
  • Tellurium forms a low level of Carbide when the surface is ion etched inside the analysis chamber

 

Commonplace Contaminants

  • Carbon and Oxygen are common contaminants that appear on nearly all surfaces. The amount of Carbon usually depends on handling.
  • Carbon is usually the major contaminant.  The amount of carbon ranges from 5-50 atom%.
  • Carbon contamination is attributed to air-borne organic gases that become trapped by the surface, oils transferred to the surface from packaging containers, static electricity, or handling of the product in the production environment.
  • Carbon contamination is normally a mixture of different chemical states of carbon (hydrocarbon, alcohol or ether, and ester or acid).
  • Hydrocarbon is the dominant form of carbon contamination. It is normally 2-4x larger than the other chemical states of carbon.
  • Carbonate peaks, if they appear, normally appear ~4.5 eV above the hydrocarbon C (1s) peak max BE.
  • Low levels of carbonate is common on many s that readily oxidize in the air.
  • High levels of carbonate appear on reactive oxides and various hydroxides.  This is due to reaction between the oxide and CO2 in the air.
  • Hydroxide contamination peak is due to the reaction with residual water in the lab air or the vacuum.
  • The O (1s) BE of the hydroxide (water) contamination normally appears 0.5 to 1.0 eV above the oxide peak
  • Sodium (Na), Potassium (K), Sulfur (S) and Chlorine (Cl) are common trace to low level contaminants
  • To find low level contaminants it is very useful to vertically expand the 0-600 eV region of the survey spectrum by 5-10X
  • A tiny peak that has 3 or more adjacent data-points above the average noise of the background is considerate to be a real peak
  • Carbides can appear after ion etching various reactive s.  Carbides form due to the residual CO and CH4 in the vacuum.
  • Ion etching can produce low oxidation states of the material being analyzed.  These are newly formed contaminants.
  • Ion etching polymers by using standard Ar+ ion guns will destroy the polymer, converting it into a graphitic type of carbon

 Periodic Table 


 

Data Collection Guidance

  • Chemical state differentiation can be difficult
  • Collect principal Te (3d5/2) peak
  • Long time exposures (high dose) to X-rays can degrade various polymers, catalysts, high oxidation state compounds
  • During XPS analysis, water or solvents can be lost due to high vacuum or irradiation with X-rays or Electron flood gun
  • Auger signals can sometimes be used to discern chemical state shifts when XPS shifts are very small

 Periodic Table 


 

Data Collection Settings for Metal (Te)

  • Conductivity:  Tellurium readily develops a native oxide that is sensitive to Flood Gun – Differential Charging Possible – float sample recommended
  • Primary Peak (XPS Signal) used to measure Chemical State Spectra:  Te (3d5/2) at 573 eV
  • Recommended Pass Energy for Measuring Chemical State Spectrum: 40-50 eV    (Produces Ag (3d5/2) FWHM ~0.7 eV)
  • Recommended # of Scans for Measuring Chemical State Spectrum:  4-5 scans normally   (Use 10-25 scans to improve S/N)
  • Dwell Time:  50 msec/point
  • Step Size:  0.1 eV/point   (0.1 eV/step or 0.1 eV/channel)
  • Standard BE Range for Measuring Chemical State Spectrum:  565- 590 eV
  • Recommended Extended BE Range for Measuring Chemical State Spectrum:  560 – 660 eV
  • Recommended BE Range for Survey Spectrum:  -10 to 1,100 eV   (above 1,100 eV there are no useful XPS signals, except for Ge, As and Ga, above 1100 is waste of time)
  • Typical Time for Survey Spectrum:  3-5 minutes for newer instruments, 5-10 minutes for older instruments
  • Typical Time for a single Chemical State Spectrum with high S/N:  5-10 minutes for newer instruments, 10-15 minutes for older instruments 

 Periodic Table 


 

Effects of Argon Ion Etching

  • Carbides appear after ion etching Te and various reactive surfaces.  Carbides form due to the presence of residual CO and CH4 in the vacuum.
  • Ion etching can produce low oxidation states of the material being analyzed.  These are newly formed contaminants.
  • Ion etching polymers by using standard Ar+ ion guns will destroy the polymer, converting it into a graphitic type of carbon

 Periodic Table 

Copyright ©:  The XPS Library 


Gas Phase XPS or UPS Spectra


 

Chemical State Spectra from Literature

from Thermo website




End of File