Our International XPS Spectra-Base
The terms “XPS database” and “XPS Spectra-Base” refer to collections of High Quality Reliable XPS Reference Spectra used in X-ray Photoelectron Spectroscopy (XPS) for materials analysis. These databases contain essential information like binding energies, atom %s, tables of BEs, Overlays of related materials and Auger kinetic energies, which characterize the elements and their chemical states in a commercially pure material.
This commercial database offers monochromatic XPS reference spectra and binding energy (BE) tables, often as part of data processing software package or through a paid membership. It features a large library of spectra from hundreds of common materials, including polymers, oxides, and semiconductors.
XPS Spectra-Bases are crucial for:
- Identification: Matching measured electron energies from an unknown sample to known reference values to identify the elements present.
- Chemical State Analysis: Determining small shifts in binding energies (chemical shifts) that indicate how an element is bonded within a compound.
- Quantification: Providing necessary physical parameters (like relative sensitivity factors or cross-sections) for accurate quantitative analysis of material composition.
- Troubleshooting and Quality Control: Serving as a reliable reference for comparing experimental results and ensuring consistency in analysis.
The data in these spectra-bases are typically critically evaluated by experts to ensure reliability of chemical state assignments.
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| Feature | Table of Numerical BE Numbers (NIST SRD 20) |
International XPS Spectra-Base of High Quality XPS Reference SPECTRA |
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| Cost | Free to use online. Quality of surface chemistry of chemicals used unknown. | Purchased (at a modest cost compared to buying instrument, pure chemicals, and making spectra internally). | ||||
| Data Type | ONLY NUMBERS (binding energies, kinetic energies, chemical shifts, etc.). NO SPECTRA | Contains full sets of reference spectra (BEs, FWHMs, satellite bands, peak shapes, peak-fits, VBs, survey spectra, atom% of surveys, tablesof BEs from NIST and others etc.) which are essential for reliable chemical state assignments. | ||||
| Data Quality | Data is compiled from thousands of published literature over many years with modest level of peer review and accuracy. Reliability is uncertain. | Spectra are typically measured on modern, well-calibrated instruments by experts using standardized procedures. | ||||
| Data Quantity | 30,000 numbers, unverified, NO Spectra, poor calibration | Contain thousands of high-quality reference grade spectra for various materials (polymers, oxides, etc.). | ||||
| Reliability Concerns | Old entries suffer from BE referencing variations due to the many different instrument calibration methods used by various analysts and recommended by instrument makers. | Generally considered more reliable for specific spectral analysis because the data is collected under controlled, modern conditions and includes complete spectral information. | ||||
| Integration | Web-based access, recently updated with new features like chemical shift plots and Wagner plots. | Web-based access. Various Versions. Software and raw data are available for purchase. | ||||
Summary
- Commercial databases are the tools of choice for professional analysts in industry or research labs that require high confidence in chemical state assignments. They provide complete, high-quality reference spectra that are essential for accurate peak fitting and detailed analysis, which is difficult to do with just numerical values.
- Use the NIST XPS Database for general reference, initial element identification, and for academic research where access to a free, foundational data set is necessary. It is excellent for identifying unknown lines and checking general values.