3 day TRIAL Membership to The International Spectra-Base of Monochromatic XPS Reference Spectra ($5/day) SKU# XPS-SpectraBase-05

Description

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DETAILED DESCRIPTION

3 day Trial Membership to
The International XPS Spectra-Base of
Monochromatic XPS Reference Spectra  ($5/day)

SKU# XPS-SpectraBase-05

$15 for 3 days trial ($5/day)

You must Register and then Log-in
before you can Purchase any Membership

 

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After Purchase is completed, the details about your new Membership (License)
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First:  Register to become Member

 

 

 

Second:  Log-in using your
E-mail address and your Password

 

 

 

Check your E-mail for Delivery of your Temporary Password

 

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“Read This to learn the details of your Purchased Membership”

After Purchase is completed, the details about your new Membership (License)
and a hidden webpage are shown in My Account (your account)
and in an E-mail sent to you.

 

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To add this item for purchase, then go to the “Add to Cart” button at the bottom of this page.
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To learn more about this product, then continue to scroll down this page. 

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Overview

Each page provides XPS spectra from a series of materials:  pure element, native oxide, most common pure oxide, and other chemical compounds that may include hydroxide, oxy-hydroxide, carbonate, bi-carbonate, sulfide, sulfate, nitride, nitrate, phosphide, phosphate, selenide, telluride. Most of the oxides are single crystals or natural crystals freshly cleaved to expose bulk. Semiconductor wafers and crystals have been cleaved to expose bulk. There are time-based Profiles, Flood Gun tests, and Auger spectra. To add a bit of color, there are two sets of photos from crystals that include the element being displayed. A total of six (6) different BE tables from various sources are included.

The Spectra-Base currently (Jan 2025) has:

• • • >500 survey spectra,
    • >2,500 chemical state spectra,
    • >2,500 peak-fits of chemical state spectra,
    • >600 overlays of chemical state spectra,
    • >400 side-by-side comparisons of chemical state spectra.
    • >150 time study Montage plots showing UHV gas capture by freshly ion etched metals,
    • >150 overlays showing flood gun effects on native oxides
    • >200 photos of minerals containing element of interest
    • >90 tables of key information listing peak overlaps, spin-orbit terms, BEs, Scofield cross-sections and IMFP of pure element
    • >500 tables of BEs (from 6 different sources)

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Components on each Page:

Basic Information Section  (spectra and BE tables)

• Three (3) links to:  (a) Periodic Table,  (b) XPS Database of Polymers, and  (c) Six (6) BE Tables
• ….Page Index (not yet active).
• Chemical State Spectra (raw and peak-fit with details)
• Survey Spectra (fully labelled, pure element, native oxide, pure oxide, other chemical states)
• Carbon (1s) and O (1s) spectra (or F (1s), S (2p), N (1s), P (2p), Cl (2p), Br (3d), I (4d), Se (3d), Te (4d) etc.)
• Valence Band Spectra
• Spectra of Auger Signals
• Plasmon Spectra
• Table of Overlaps, BEs, Scofield cross-sections, and IMFP
• Links to home page – Periodic Table and Six (6) BE Tables
• Artefacts of ion etching
• Side-by-side spectra for comparisons (native oxide versus element versus pure oxide…)
• Overlays of related spectra (e.g. metal, native oxide, pure oxide, sulfide, BE shifts, peak-shape differences)
• Six (6) Tables of Chemical State BEs from different websites (BEs are from smallest to largest)
• The NIST table is quite long and organized by BE value (smallest to largest)
• Histograms of pure element BEs, pure oxide BEs and others from NIST SRD-20 database of BEs
• Periodic Table showing results of Statistical Analysis of BEs in NIST SRD-20 database of BEs

Advanced Information Section  (advanced spectra & research studies)

• Comparison of Element, Pure Oxide, and Fluoride of the Element (showing extreme range of BEs)
• Detailed set of spectra from common pure oxide
• Display of spectra having Shake-up
• Display of spectra having Multiplet Splitting
• Flood gun effect on Native Oxide of Element  (flood gun OFF versus ON and Floating:  C (1s) O (1s) and Metal Signal)
• XPS Study of UHV Gas Captured by Freshly Ion Etched Element – in main analysis chamber – overnight run – C (1s), O (1s) and metal signal
• AES (Auger) Study of UHV Gas Captured by Freshly Ion Etched Element – in main analysis chamber – overnight run – C (1s), O (1s) and metal signal
• Chemical State Spectra from High Energy Resolution Auger instrument having CHA (HSA) electron analyzer

Tables of XPS Facts, Guidance & Information

• Basic information about element
• Information useful for peak-fitting main element signal
• General guidance for peak-fitting
• Commonplace Contaminants
• Data collection guidance
• Data collection settings for each element
• Effects of argon ion etching
• Gas phase spectra of related species if available

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